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AbstractAbstract
[en] Electro-beam-induced-current, electron diffraction and X-ray electroprobe have been employed to study the initial stages of growth of CdTe films vacuum. The presence of inhomogeneity in the conduction can be explained by considering the deviation from stoichiometry for film samples prepared by sublimation of CdTe. Initially the film are tellurium-rich and p-type. Later a cadmium-rich layer which is n-type may be deposited onto the initial layer. Thes may lead to a change in the conduction type with the film thickness
Original Title
Vliyanie kinetiki rosta na strukturnye i ehlektrofizicheskie svojstva plenok tellurida kadmiya
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Record Type
Journal Article
Journal
Poverkhnost': Fizika, Khimiya, Mekhanika; CODEN PFKMD; (no.5); p. 107-112
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