Sacchi, Maurizio; Hague, Coryn F.; Pasquali, Luca; Mirone, A.; Mariot, Jean-Michel; Isberg, P.; Gullikson, Eric M.; Underwood, James H.
Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (United States). Funding organisation: US Department of Energy (United States)1998
Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (United States). Funding organisation: US Department of Energy (United States)1998
AbstractAbstract
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LBNL/ALS--1091; AC03-76SF00098; Journal Publication Date: August 17 1998
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Chiuzbăian, Sorin G.; Hague, Coryn F.; Brignolo, Stefania; Baumier, Cédric; Lüning, Jan; Avila, Antoine; Delaunay, Renaud; Mariot, Jean-Michel; Jaouen, Nicolas; Polack, François; Thomasset, Muriel; Lagarde, Bruno; Nicolaou, Alessandro; Sacchi, Maurizio, E-mail: gheorghe.chiuzbaian@upmc.fr2014
AbstractAbstract
[en] A soft x-ray spectrometer based on the use of an elliptical focusing mirror and a plane varied line spacing grating is described. It achieves both high resolution and high overall efficiency while remaining relatively compact. The instrument is dedicated to resonant inelastic x-ray scattering studies. We set out how this optical arrangement was judged best able to guarantee performance for the 50 − 1000 eV range within achievable fabrication targets. The AERHA (adjustable energy resolution high acceptance) spectrometer operates with an effective angular acceptance between 100 and 250 μsr (energy dependent) and a resolving power well in excess of 5000 according to the Rayleigh criterion. The high angular acceptance is obtained by means of a collecting pre-mirror. Three scattering geometries are available to enable momentum dependent measurements with 135°, 90°, and 50° scattering angles. The instrument operates on the Synchrotron SOLEIL SEXTANTS beamline which serves as a high photon flux 2 × 200 μm2 focal spot source with full polarization control
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(c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
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