[en] Recent trends of synchrotron radiation spectroscopy, especially X-ray absorption spectroscopy for industrial applications are introduced based on our latest results for energy efficient devices such as magnetic RAM, LSI and organic FET, power generation devices such as fuel cells, and energy storage devices such as Li ion batteries. Furthermore, future prospects of spectroscopy with higher energy resolution, higher spatial resolution, higher temporal resolution and operando spectroscopy taking advantage of much brighter synchrotron radiation beam at low emittance SR rings are discussed from the view point of practical applications. (author)

No abstract available

[en] The magnetic interaction between transition metals in Cr-doped manganites: LaCr_xMn_1-xO₃ has been investigated both by soft X-ray magnetic circular dichroism (soft-XMCD) and Monte Carlo simulation. Samples were prepared by conventional solid-state reaction. In the soft-XMCD measurements, we observed magnetic moments only for Mn. Magnetization measurement also supports the disappearance of the Cr magnetization. From Monte Carlo simulation results, the disappearance of Cr magnetic moments could only be observed under the condition that the superexchange interaction of Mn-Mn is ferromagnetic and Mn-Cr and Cr-Cr is antiferromagnetic. The antiferromagnetic superexchange interaction of Mn-Cr can not be explained by Kanamori-Goodenough rules

[en] We constructed a high-resolution, high-throughput photoemission spectroscopy (PES) system combined with a combinatorial laser molecular-beam epitaxy thin-film growth system in order to realize in-situ characterization for electronic structures of transition-metal oxide (TMO) heterointerfaces. The elemental selectivity of the PES technique using synchrotron radiation enables us to extract the electronic structure of constituent layers in the vicinity of the heterointerface. Direct observation of the interfacial electronic structures is a key to understanding the physical and chemical properties of junctions based on TMO. The capabilities of the technique have been demonstrated by the in-situ resonant PES analysis of La_0.6Sr_0.4MnO₃ layers buried in insulating perovskite oxides, such as La_0.6Sr_0.4FeO₃ and SrTiO₃ (STO). (author)

[en] Auger electron spectroscopy of insulator polyimide films has been studied from the viewpoint of discharging effect in order to facilitate surface analysis of contact hole formed by Ar laser beam irradiation. Polyimide surface was found to become conductive by electron bombardment. The conductive layer formation is easily observed by SEM absorption image, and is found to be slightly lack of imide bonding. By means of the conductive layer and evaporated Al pattern, Auger analysis with high energy electron beam and high incident angle was accomplished without charging-up phenomena. (author)

[en] A simplified quantitative procedure for SIMS, based on the LTE (Local Thermal Equilibrium) model, was proposed and applied to Na concentration determination in Si and SiO². The procedure validity was checked using In sub(0.1)Ga sub(0.9)As and PSG (phospho-silicate glass) films as standard samples. Na concentration determination was carried out using a Si wafer, whose C sub(Na) was measured by activation analysis. In the case of SiO², borosilicate glasses were analyzed taking into account Na ionization yield. Then, Na distribution in SiO² films was measured by SIMS and was compared with the total amount of Na in SiO² films obtained by electrical measurement and Atomic Absorption Spectrophotometry (AAS). (author)

[en] A compact beam intensity monitor detecting an X-ray excited sample current from a thin metal foil was developed for micro X-ray absorption fine structure (XAFS) measurements. By utilizing gas amplification caused by the ejected photoelectrons or Auger electrons, the monitor can achieve better sensitivity than what can be realized with the ionization chamber. Fluctuation of the beam intensity through the pinhole of 10 μm was precisely measured by using this monitor, and the XAFS spectrum from a Ni thin foil was successfully measured with adequate normalization

[en] The use of medium-sized highly brilliant soft X-ray synchrotron radiation (SR) enables analyses with much better spatial, energy and time resolution, resulting in visualizing surface/interface electronic structure in nano regions. In order to improve performances of electronic, magnetic and energy devices, it is required to characterize and control electronic structures. In the world, several SR rings with the emittance of less than 1 nmrad are being constructed, aiming at revolutionary progress of surface/interface sciences using soft X-rays. Although we have constructed the University of Tokyo Outstation at SPring-8 for soft X-ray surface/interface sciences, medium-sized highly brilliant SR ring is strongly required for further development in this field. In this article, nano-region photoelectron spectroscopy for graphene FET and ReRAM, soft X-ray emission spectroscopy for fuel cells and Li ion batteries, and time-resolved photoelectron spectroscopy for photocatalysts are introduced, and future prospects of soft X-ray surface/interface sciences are discussed. (author)

[en] Synchrotron radiation surface research has shown drastic progress in these twenty years mainly owing to higher brilliance of synchrotron radiation sources and higher sensitivity and/or resolution of detectors. We have developed an in situ analysis system combined with a thin film growth chamber for advanced device applications, and have used this system as a nano-space laboratory for analyzing surface/interface electronic structures. (author)

[en] This paper reports the preliminary results of monochromatization at BL-1A in the 50-900 eV range with gratings, which is the first step of wide energy range monochromatization. (orig./HSI)