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[en] This paper describes a design study with the objective of optimizing spectral performance of an elliptical wiggler to be installed at the Lawrence Berkeley Laboratory Advanced Light Source (ALS). This device is to produce circularly polarized radiation in the energy range of 50 eV to 10 KeV. A figure of merit, which is a function of flux density and degree of circular polarization, is introduced as the objective function for optimization. An optimum set point for a particular photon energy is characterized by values of peak vertical field, horizontal deflection parameter, and vertical aperture. Optimum performance is evaluated for the nominal ALS operating energy of 1.5 GeV

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[en] This paper describes a design study with the objective of optimizing spectral performance of an elliptical wiggler to be installed at the Lawrence Berkeley Laboratory Advanced Light Source (ALS). This device is to produce circularly polarized radiation in the energy range of 50 eV to 10 KeV. A figure of merit, which is a function of flux density and degree of circular polarization, is introduced as the objective function for optimization. An optimum set point for a particular photon energy is characterized by values of peak vertical field, horizontal deflection parameter, and vertical aperture. Optimum performance is evaluated for the nominal ALS operating energy of 1.5 GeV

[en] The performance of ALS beamline 7.0 is described. This is an integrated system for delivering radiation from a 5cm period undulator to spectroscopy and microscopy experiments across the range of photon energies from 60eV to 1200eV. The beamline is engineered to deliver the highest possible flux, with negligible deformation of the optic surfaces due to heating. Two experiment stations are served with rapid interchangeability. We report on the measured operational parameters, the resolution and flux delivered, and the refocus of the light into a small spot at the experiment

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[en] The advent of third generation synchrotron radiation x-ray sources, such as the Advanced Light Source (ALS) at Berkeley have enabled the practical realization of a wide range of new techniques in which mature chemical or structural probes such as x-ray photoelectron spectroscopy (XPS) and x-ray diffraction are used in conjunction with microfocused x-ray beams. In this paper the characteristics of some of these new microscopes are described, particularly in reference to their applicability to the characterization of semiconductor microstructures

[en] The radiation from the 5 cm period undulator at the Advanced Light Source (ALS) has been characterized using a transmission grating spectrometer. Spectral and angular distributions of radiation were measured for deflection parameter K values between 0.45 and 2.12 at low storage ring current (0.1--0.5 mA). From the calibration of the spectrometer, the absolute flux density of the undulator harmonics has been determined together with the spectral linewidth. The electron the beam emittance was determined by analyzing the angular distribution of the red-shifted fundamental. Comparison has been made with radiation calculations based upon the measured magnetic field data of the undulator. Including field errors, electron beam emittance and energy spread, good agreement is found between theoretically and experimentally determined harmonic widths and peak brightness