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Perera, R.C.C.
Lawrence Berkeley Lab., CA (United States). Funding organisation: USDOE, Washington, DC (United States)1991
Lawrence Berkeley Lab., CA (United States). Funding organisation: USDOE, Washington, DC (United States)1991
AbstractAbstract
[en] First systematic study of satellites in x-ray emission spectra was performed by Deslattes using quasi-monochromatic photon excitation from a group of Lα x-ray sources lying close to the K edge of Cl. He observed significant alterations in the Cl Kβ spectrum of KCl depending on the character of the excitation radiation and identified the initial state of these satellites as a double vacancy state. Recently, the valence electronic structure of the chlorofluoromethanes were analyzed by chlorine K x-ray emission under satellite-free conditions. These studies were based on the use of synchrotron radiation to eliminate the multivacancy effects that are inherent in conventional x-ray spectroscopy. In this report, satellite free x-ray emission spectra from chlorofluoromethanes will be presented to demonstrate that the simplified spectra can be obtained using selective photon excitation. Results from various research groups world wide, utilizing the tunable photon excitation form synchrotron sources to eliminate the obscuring features in x-ray emission spectra of rare-gas solids (RGS) and metals will be discussed. Also, the technical challenges in utilizing the small phase-space attributes of high brightness from third generation SR sources producing x-ray and vacuum ultra-violet wavelengths to study weak features like satellites in x-ray emission spectra will be presented
Primary Subject
Source
Oct 1991; 18 p; 7. national conference and exhibition on synchrotron radiation instrumentation; Baton Rouge, LA (United States); 28-31 Oct 1991; CONF-9110146--22; CONTRACT AC03-76SF00098; OSTI as DE92016999; NTIS; INIS; US Govt. Printing Office Dep
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AbstractAbstract
[en] Beamline 9.3.1 at the Advanced Light Source (ALS) is a windowless beamline, covering the 1-6 keV photon-energy range. This beamline is designed to achieve the goal of high brightness at the sample for use in the X-ray Atomic and Molecular Spectroscopy (XAMS) science, surface and interface science, biology, and x-ray optical development programs at ALS. X-ray absorption and time of flight photoemission measurements in 2 - 5 keV photon energy along with the flux, resolution, spot size and stability of the beamline will be discussed. Prospects for future XAMS measurements will also be presented
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Source
Oct 1995; 11 p; SRI '95: synchrotron radiation instrumentation symposium; Argonne, IL (United States); 16-20 Oct 1995; 7. users meeting for the advanced photon source (APS); Argonne, IL (United States); 16-20 Oct 1995; LSBL--292; CONF-9510119--6; CONTRACT AC03-76SF00098; Also available from OSTI as DE96004734; NTIS; US Govt. Printing Office Dep
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Lindle, D.W.; Perera, R.C.C.
Lawrence Berkeley Lab., CA (United States). Funding organisation: USDOE, Washington, DC (United States)1991
Lawrence Berkeley Lab., CA (United States). Funding organisation: USDOE, Washington, DC (United States)1991
AbstractAbstract
[en] This report discusses the following topics: Mother nature's finest test probe; soft x-ray emission spectroscopy with high-brightness synchrotron radiation sources; anisotropy and polarization of x-ray emission from atoms and molecules; valence-hole fluorescence from molecular photoions as a probe of shape-resonance ionization: progress and prospects; structural biophysics on third-generation synchrotron sources; ultra-soft x-ray fluorescence-yield XAFS: an in situ photon-in, photon-out spectroscopy; and x-ray microprobe: an analytical tool for imaging elemental composition and microstructure
Secondary Subject
Source
1991; 49 p; Applications of photon-in photon-out spectroscopy with third-generation synchrotron radiation sources meeting; Washington, DC (United States); 25 Apr 1991; CONF-9104248--; CONTRACT AC03-76SF00098; OSTI as DE92009147; NTIS; INIS; US Govt. Printing Office Dep
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Ederer, D.L.; Callcott, T.A.; Perera, R.C.C.
Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (United States). Funding organisation: US Department of Energy (United States)1994
Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (United States). Funding organisation: US Department of Energy (United States)1994
AbstractAbstract
No abstract available
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Source
LBL--35781; LBNL/ALS--52; AC03-76SF00098; Journal Publication Date: July/Aug. 1994
Record Type
Journal Article
Journal
Synchrotron Radiation News; ISSN 0894-0886; ; v. 7(4); [10 p.]
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
AbstractAbstract
[en] Beamline 9.3.1 at the Advanced Light Source (ALS) is a windowless beamline, covering the 1-6 keV photon-energy range. This beamline is designed to achieve the goal of high brightness at the sample for use in the X-ray Atomic and Molecular Spectroscopy (XAMS) science, surface and interface science, biology, and x-ray optical development programs at ALS. X-ray absorption and time of flight photoemission measurements in 2 - 5 keV photon energy along with the flux, resolution, spot size and stability of the beamline will be discussed. Prospects for future XAMS measurements will also be presented
Primary Subject
Secondary Subject
Source
1 Oct 1995; 18 p; SRI '95: synchrotron radiation instrumentation symposium; Argonne, IL (United States); 17-20 Oct 1995; 7. users meeting for the advanced photon source (APS); Argonne, IL (United States); 17-20 Oct 1995; LSBL--29-2; CONF--9510119-6; DE96004734; AC03-76SF00098; Also available from OSTI as DE00192521; PURL: https://www.osti.gov/servlets/purl/192521-Zy5awF/webviewable/; Supercedes report DE96004734; PBD: Oct 1995;Review of Scientific Instruments,Vol. 67, No. 9, p. 3374, 9/1/1995
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Perera, R.C.C.; Hettrick, M.C.; Lindle, D.W.
Lawrence Berkeley Lab., CA (USA); National Bureau of Standards, Washington, DC (USA)1987
Lawrence Berkeley Lab., CA (USA); National Bureau of Standards, Washington, DC (USA)1987
AbstractAbstract
[en] High resolution M/sub 4,5/ (3d → 4p) x-ray emission spectra from a krypton plasma were measured using a recently developed grazing-incidence reflection-grating monochromator/spectrometer with very high flux rates at extreme ultraviolet and soft x-ray wave lengths. The nominal resolving power of the instrument, E/ΔE, is about 300 in this energy range (∼80 eV). Three dipole-allowed 3d → 4p emission lines were observed at 80.98 eV, 80.35 eV and 79.73 eV. A broad peak at about 82.3 eV is tentatively assigned to transitions resulting from Kr2+, and effects of excitation energy on M/sub 4,5/ x-ray emission were observed. 9 refs., 3 figs., 1 tab
Primary Subject
Source
Oct 1987; 9 p; 14. international conference on X-ray and inner-shell processes; Paris (France); 14-18 Sep 1987; CONF-8709135--8; Available from NTIS, PC A02/MF A01; 1 as DE88002764; Portions of this document are illegible in microfiche products.
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Robinson, A.L.; Perera, R.C.C.; Schlachter, A.S.
Lawrence Berkeley Lab., CA (United States). Funding organisation: USDOE, Washington, DC (United States)1991
Lawrence Berkeley Lab., CA (United States). Funding organisation: USDOE, Washington, DC (United States)1991
AbstractAbstract
[en] The Advanced Light Source (ALS) at the Lawrence Berkeley Laboratory (LBL), scheduled to be operational in the spring of 1993 as a US Department of Energy national user facility, will be a next- generation source of soft x-ray and ultraviolet (XUV) synchrotron radiation. Undulators will provide the world's brightest synchrotron radiation at photon energies from below 10 eV to above 2 keV; wiggler and bend-magnet radiation will extend the spectral coverage with high fluxes above 10 keV. These capabilities will support an extensive research program in a broad spectrum of scientific and technological areas in which XUV radiation is used to study and manipulate matter in all its varied gaseous, liquid, and solid forms. The ALS will also serve those interested in developing the fabrication technology for micro- and nanostructures, as well as characterizing them
Primary Subject
Source
Oct 1991; 5 p; 4. international conference on synchrotron radiation instrumentation; Chester (United Kingdom); 15-19 Jul 1991; CONF-910730--30; CONTRACT AC03-76SF00098; OSTI as DE92011728; NTIS; INIS; US Govt. Printing Office Dep
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Lindle, D.W.; Perera, R.C.C.
Lawrence Berkeley Lab., CA (USA)1988
Lawrence Berkeley Lab., CA (USA)1988
AbstractAbstract
[en] The ''Workshop on New Directions in Soft X-Ray Near-Threshold Phenomena'' was held at the Asilomar Conference Center in Pacific Grove, CA on March 1--4, 1987. It was attended by 59 scientists from 8 countries, representing 27 institutions. Major funding for the meeting was donated by L-Division of the Lawrence Livermore National Laboratory, who hosted and organized two previous workshops on photoabsorption and scattering in the soft x-ray energy range. Additional funding was provided by the User's Group of the Advanced Light Source. The Workshop, as its name suggests, emphasized physical phenomena in atoms, molecules, and solids near inner-shell thresholds. Of particular interest were threshold ionization, post-collisional interaction, resonant photoemission and fluorescence, and multi-electron effects such as shake-up and shake-off. In these areas and others, special consideration was given to presenting recent discoveries and potential ''new directions'' for future work
Primary Subject
Source
Jul 1988; 56 p; Annual SDI technical achievements symposium; Pacific Grove, CA (USA); 1-4 Mar 1987; CONF-870353--SUMM; Available from NTIS, PC A04/MF A01 - OSTI; 1 as DE89008857; Portions of this document are illegible in microfiche products.
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Perera, R.C.C.; Cowan, P.L.; Lindle, D.W.; LaVilla, R.E.
Lawrence Berkeley Lab., CA (USA); National Bureau of Standards, Washington, DC (USA)1987
Lawrence Berkeley Lab., CA (USA); National Bureau of Standards, Washington, DC (USA)1987
AbstractAbstract
[en] With the availability of tunable synchrotron radiation sources, unoccupied molecular orbits (below vacuum level) can be selectively populated producing highly excited neutral molecules. X-ray fluorescence spectra from molecules were obtained with excitation below the ionization threshold and were observed to have significant intensity changes, absolute and relative energy position shifts and line width changes as compared to fluorescence spectra excited above the threshold. As an example, the Cl Kβ (K-V) emission spectra from CF3Cl vapor are presented. The energy shifts and intensity changes are explained in terms of perturbation effects due to the presence of an electron in an unoccupied molecular orbital. The narrow line widths obtained in the spectra excited below threshold are explained in terms of the ''effective'' hole production region in a core state limited by the broadening of the unoccupied level. The change in line widths as a function of below-threshold excitation energy is proposed as a novel technique to study the localized properties and reorganization effects of a hole in a core level. 10 refs., 4 figs., 1 tab
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Secondary Subject
Source
Oct 1987; 9 p; 14. international conference on X-ray and inner-shell processes; Paris (France); 14-18 Sep 1987; CONF-8709135--7; Available from NTIS, PC A02/MF A01; 1 as DE88002763; Portions of this document are illegible in microfiche products.
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Berkeland, D.J.; Underwood, J.H.; Perera, R.C.C.
Lawrence Berkeley Lab., CA (USA)1988
Lawrence Berkeley Lab., CA (USA)1988
AbstractAbstract
[en] The purpose of this work is to develop a method of sizing sub-micron particles using small-angle soft x-ray diffraction. Solid poly-styrene spheres of known sizes were used as scattering samples, with C-Kα (44.8/angstrom/) and V-Lα (24.3/angstrom/) radiation from a conventional x-ray source. Two devices were used to diffract the x-rays. One collimates the radiation using a series of pinholes immediately preceding the sample, and directs the unfocussed radiation onto film placed far from the sample. The other utilizes radiation from a single pinhole above the source onto the sample and a spherical multilayer mirror in series, so that the radiation passes twice through the sample and is focused onto film immediately above the pinhole assembly to increase the effective sample area. Using the latter device, two types of diffraction patterns were obtained: a sharp, relatively small pattern from spheres which form a hexagonal lattice structure, and a diffuse, larger pattern from an unordered, or random, array of spheres. Both patterns are presented in this work, along with the calculations, based upon light scattering from an unordered and an ordered array of particles, of the scattering patterns. 9 refs., 32 figs., 2 tabs
Source
Oct 1988; 72 p; Available from NTIS, PC A04/MF A01 - OSTI; 1 as DE89013353; Portions of this document are illegible in microfiche products.
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