[en] Resonant soft X-ray emission spectroscopy (SXES) has become a powerful tool for investigating the electronic structure of a large variety of materials and systems. This is due to the vastly improved performance of third generation high brightness synchrotron radiation sources and soft X-ray emission spectroscopy dedicated beamlines. The experiments presented here were performed at two synchrotron facilities: beamline 7.0.1 at the Advanced Light Source (Berkeley, CA, USA) and beamline I5-11c at MAXLAB (Lund, Sweden). We show that resonant soft X-ray emission spectroscopy can give valuable information about the electronic structure of highly correlated materials such as cuprates and vanadates. Recently, we have succeeded in constructing soft X-ray window-sealed liquid cell containers for the study of the electronic structure of liquid state samples. Here we present some first results from salt solutions showing how information on the water-ion interaction can be extracted

[en] This volume brings together theorists, modelers and experimentalists working in the field of actinide science to present and discuss the latest breakthroughs in a field that spans materials science, condensed matter physics and chemistry

[en] It is proved that approaches with Λ-valued configurations cannot be the proper answer to the question what a classical fermion field is. That's why a program based on supergeometry is presented in order to understand classical fermion fields

[en] Published in summary form only

No abstract available

[en] Full text: High-quality hot-filament chemical vapor deposition (CVD) diamond surfaces (as grown on polished Si wafers) were subjected to tribomechanical wear by rotating a disk under the friction of a diamond coated ball in various environments. We investigated the resulting wear tracks and their vicinity by utilizing near edge x-ray absorption e structure (NEXAFS) spectroscopy and x-ray emission spectroscopy at the C 1s- absorption edge. Our NEXAFS spectra have both high energy resolution (0.05eV steps) and unprecedented high spatial resolution (10μm spot size), thereby allowing us to resolve changes within individual wear- tracks. We find that the degree of chemical modification in the wear tracks strongly depends upon the type of environment during the wear process. Moreover, the effect of wear depends on whether the initial surface is smooth (polished Si-wafer substrate side) or rough (the as-grown vacuum side). We discuss the nature of chemical modification that can be determined by certain spectral signatures of NEXAFS spectra from model compounds from literature. In particular, we address the question to which degree graphitization and other phase transformations, such as amorphization and ex situ reactions, take place. We discuss the features and advantages that this technique has compared to photoelectron emission microscopy

[en] Published in summary form only

[en] Published in summary form only

[en] Metal-oxide mixtures form eutectic structures when melted with group Va and VIa metals. With the appropriate composition of the oxide mixture, the metal occurs as ordered fibers embedded in the oxide matrix. The eutectics in these systems are of the faceted-nonfaceted type in which the oxide matrix exhibits faceted and the metallic phase nonfaceted growth. From metallographic and SEM studies conclusions concerning the growth mechanisms in these systems can be drawn. With help of metallographic and SEM investigations a model of formation of eutectic structures in a binary system is discussed. (orig.)

[en] The results show clear decreases in the melting point of the above systems. The reproducibility is good with maximum standard deviations of +-23⁰C for pure alumina and +-31⁰C for a mixture containing 60% Al₂O₃ and 40% Cr₂O₃. A standard deviation of +-30⁰C is equivalent to 4% at a temperature of 1680⁰C. The melting points of mixtures of 60% Al₂O₃ + 40% Cr₂O₃ and 45% Al₂O₃ + 55% Cr₂O₃ were found to be 335⁰C and 410⁰C respectively lower than the melting point of pure aluminia (1970⁰C). (orig.)