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AbstractAbstract
[en] The conference covered many of the tools of the trade as follows: fast CCD detectors, fast video digitization and framing, picosecond framing cameras, and x-ray backlighting. The papers in the applications area covered a wide cross-section of phenomena: scanning microscopy with ultrafast pulses, plasma magnetic field characterization, imaging the interaction of lasers with surfaces, aerospace testing, ion beam diagnostics, shock wave studies, and metal jet characterization. Fundamental studies in high-speed imaging were also represented. Advances in framing cameras that can image phenomena as short as 30 ps were reported. Photocathode sensitivity was discussed; photoelectron throughput in streak cameras was covered; resolution and shutter time effects in fast video systems were discussed; and charge transfer efficiency modeling and intensifier studies were presented. High-speed as well as low-speed imaging were covered with special emphasis on the understanding of the methods to speed up video recording. Separate abstracts were prepared for most papers in this volume
Source
Proceedings/SPIE, Volume 2549; 1995; 297 p; SPIE--The International Society for Optical Engineering; Bellingham, WA (United States); 40. annual meeting of the Society of Photo-Optical Instrumentation Engineers; San Diego, CA (United States); 9-14 Jul 1995; CONF-950793--; ISBN 0-8194-1908-7; ; ISSN 1018-7928; ; SPIE--The International Society for Optical Engineering, P.O. Box 10, Bellingham, WA 98227-0010 (United States)
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Book
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Conference
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