[en] Theoretical analysis of dependence of light flux intensity on scintillator thickness is carried out. It has allowed to optimize the choice of thickness and type of scintillation material for detection of x-ray and gamma radiation within 0.01-10000 MeV energy range. Optimal thickness for CsI(Tl), CdWO₄, Bi₄GeO₁₂ and ZnSe scintillators at photon detection within the enrgy given range are determined. ZnSe crystals tured to be the optimal ones to detect radiation within 0.3-0.5 MeV energy range. It is advisable to use scintillators with high atomic number that is Cd₄ and Bi₄GeO₁₂ within the range of higher energy

[en] A theoretical analysis of luminous-flux intensity as a function of crystal thickness is performed for various photon energies, and the optimal thicknesses of CsI(Tl), CdWO₄, Bi₄Ge₃O₁₂, and ZnSe crystals are determined for registration of photons with energies of from a few kiloelectron volts to hundreds of megaelectron volts

[en] Calculational results on γ-quanta spectral distributions by value of energy releases in a detector during registration of mono-energy γ-radiation within the energy range of 0.1-10 MeV through various-size scintillation detectors of the CsI(Tl), CdWO₄ and Bi₄Ge₃O₁₂ materials are presented. Relative numbers of γ-quanta at the photo-peak and values proportional to complete light yield are determined for these scintillators. 11 refs., 6 figs

[en] It is suggested to use multilayer scintillation detector as X-ray exposure meter. Calculation technique for detector parameters, which corresponds to sensitivity of X-ray film, is presented. Calculation results for parameters of three-layer X-exposure meter, which spectral characteristic differs from spectral sensitivity of X-ray film by ≤11% within 20-240 keV energy range, are given