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AbstractAbstract
No abstract available
Source
p. 718-724; 1972; Inst. of Electrical and Electronics Engineers, Inc; New York; Applied superconductivity conference; Annapolis, Maryland, USA; 1 May 1972
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AbstractAbstract
No abstract available
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Journal Article
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Proc. IEEE (Inst. Elec. Electron. Eng.); v. 61(1); p. 51-54
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AbstractAbstract
No abstract available
Source
p. 709-711; 1972; Inst. of Electrical and Electronics Engineers, Inc; New York; Applied superconductivity conference; Annapolis, Maryland, USA; 1 May 1972
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AbstractAbstract
No abstract available
Original Title
Oscillations nonlineaires d'une jonction Josephson avec echange d'energie entre la jonction, le champ magnetique, et le champ electrique
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Source
Swiss Physical Society autumn meeting; Berne, Switzerland; 7 - 8 Oct 1977; Published in summary form only.
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Journal Article
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Helvetica Physica Acta; v. 51(1); p. 75
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AbstractAbstract
No abstract available
Source
Timmerhaus, K.D.; O'Sullivan, W.J.; Hammel, E.F. (eds.); p. 568-571; 1974; Plenum Publishing Corp; New York; 13. international conference on low temperature physics; Boulder, Colorado, USA; 21 Aug 1972
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Book
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AbstractAbstract
No abstract available
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Journal Article
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Journal of Chemical Physics; v. 57(7); p. 2906-2910
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AbstractAbstract
No abstract available
Source
Timmerhaus, K.D.; O'Sullivan, W.J.; Hammel, E.F. (eds.); p. 580-584; 1974; Plenum Publishing Corp; New York; 13. international conference on low temperature physics; Boulder, Colorado, USA; 21 Aug 1972
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AbstractAbstract
[en] A voltmeter of sensitivity 2 x 10-15V/√Hz(2 fV/√Hz) is based on direct conversion of the voltage to be measured into a frequency according to the Josephson voltage-frequency relation. Self-pumped parametric amplification in a d.c. biased loop containing two Josephson junctions and a measuring resistance Rsub(s) = 4.7 x 10-9 Ω amplifies the femptovolt level voltages across Rsub(s) to microvolt levels that can be observed with a room temperature amplifier. The sensitivity of the femptovoltmeter is determined by Johnson-Nyquist noise voltages at 4.2 K in the 4.7 x 10-9 Ω resistance. (Auth.)
Source
Swiss Physical Society autumn meeting; Bern, Switzerland; 7 - 8 Oct 1977
Record Type
Journal Article
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Conference
Journal
Zeitschrift fuer Angewandte Mathematik und Physik; ISSN 0044-2275; ; v. 29(2); p. 359-361
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AbstractAbstract
[en] A current biased, resistively shunted Josephson Junction irradiated at two frequencies is considered. The perturbation technique introduced by Aslamasov and Larkin is used in the calculations, and both signals are treated as perturbations. The second order calculation yields the size of the mixing steps at V/sub +-/ = h(ω1 +- ω2)/2e. As in the case of a single frequency, subharmonic mixing steps are absent. The amplitude of the voltage oscillation at the difference and sum frequencies is shown to be non-zero at all voltages. The microwave resistance is calculated for one frequency ω2 to third order in the perturbation. There are negative resistance regions near V/sub +-/ (as well as near V2 = hω2/2e). Near V/sub -/, the negative resistance region appears for bias voltage V just above V/sub -/, while near V the region appears for V just below V/sub +/. This means that when an incident frequency mixes with a cavity mode, the mixing step at V/sub -/ will be inverted compared to the cavity step itself
Source
Applied superconductivity conference; Oakbrook, Illinois, USA; 30 Sep 1974; See CONF-740957--.
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Journal Article
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Conference
Journal
IEEE Transactions on Magnetics; v. MAG-11(2); p. 807-810
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Levinsen, M.T.; Ulrich, B.T.
International conference on submillimeter waves and their applications1974
International conference on submillimeter waves and their applications1974
AbstractAbstract
[en] A Josephson junction 1.6 mm wavelength microwave source has been used to demonstrate the parametric amplification by reflection necessary to maintain parametric oscillations at 1.6 mm wavelength. A perturbation calculation based on the resistively and capacitively shunted Josephson junction model gives a negative effective microwave resistance for a junction biased at voltages higher than the voltage for a cavity induced step. The parametric oscillation was observed at voltages consistent with the region in which negative resistance was calculated
Primary Subject
Source
Institute of Electrical and Electronics Engineers, Inc., New York (USA). Society on Microwave Theory and Techniques; p. 50-51; 1974; International conference on submillimeter waves and their applications; Atlanta, Georgia, USA; 5 Jun 1974
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Report
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