[en] Digital holographic microscopy has been a powerful metrological technique for phase-contrast imaging. However inherent phase aberrations always exist and degrade the quality of the phase-contrast images. A surface fitting method based on an improved mathematic model is proposed, which can be used to remove the phase aberrations without any pre-knowledge of the setup or manual operation. The improved mathematic model includes not only the usual terms but also the cross terms and the high order terms to describe the phase aberrations with high accuracy. Meanwhile, a non-iterative algorithm is used to solve the parametersand thus less computational load is imposed. The proposed method is applied to the live imaging of cells. The experimental results verify its validity. (fundamental areas of phenomenology(including applications))