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AbstractAbstract
[en] Ferroelectric SrBi2Nb2O9 (SBN) thin films were prepared by the polymeric precursors method and deposited by spin coating onto Pt/Ti/SiO2/Si substrate and crystallized using a domestic microwave oven. It was studied the influence of the heat flux direction and the duration of the thermal treatment on the films crystallization. An element with high dielectric loss, a SiC susceptor, was used to absorb the microwave energy and transfers the heat to the film. Influence of the susceptor position to the sample crystallization was verified, the susceptor was placed or below the substrate or above the film. The SBN perovskite phase was observed after a thermal treatment at 700 deg. C for 10 min when the susceptor was placed below the substrate and for 30 min when the susceptor was placed above the film. Electrical measurements revealed that the film crystallized at 700 deg. C for 10 min, with the susceptor placed below the film, presented dielectric constant, dielectric loss, remanent polarization and coercive field of, 67, 0.011, 4.2 μC/cm2 and 27.5 kV/cm, respectively. When the films were crystallized at 700 deg. C for 30 min, with the susceptor placed above the film, the dielectric constant was 115 and the dissipation factor was around of 0.033, remanent polarization and coercive field were 10.8 μC/cm2 and 170 kV/cm, respectively
Primary Subject
Source
S0169433203011772; Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Record Type
Journal Article
Journal
Country of publication
ALKALINE EARTH METAL COMPOUNDS, APPLIANCES, CHALCOGENIDES, DIELECTRIC MATERIALS, DIELECTRIC PROPERTIES, DIMENSIONLESS NUMBERS, ELECTRIC APPLIANCES, ELECTRICAL EQUIPMENT, ELECTRICAL PROPERTIES, ELECTROMAGNETIC RADIATION, ENERGY, EQUIPMENT, FILMS, MATERIALS, MINERALS, NIOBIUM COMPOUNDS, OVENS, OXIDE MINERALS, OXIDES, OXYGEN COMPOUNDS, PEROVSKITES, PHASE TRANSFORMATIONS, PHYSICAL PROPERTIES, RADIATIONS, REFRACTORY METAL COMPOUNDS, SILICON COMPOUNDS, TRANSITION ELEMENT COMPOUNDS
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Zanetti, S.M.; Bernardi, M.I.; Santos, I.M.G.; Gama, L.; Maurera, M.A.M.A.; Ronconi, C.M.; Leite, E.R.; Longo, E.
Proceedings of the 41. Brazilian congress on ceramics; 2. Congress on ceramics and industrial minerals from MERCOSUL. v. 21997
Proceedings of the 41. Brazilian congress on ceramics; 2. Congress on ceramics and industrial minerals from MERCOSUL. v. 21997
AbstractAbstract
[en] Sr Ti O3 thin films, obtained by the polymeric precursors method, were obtained by dip coating on Si (111) single crystal substrate and heat treated at 850 deg C X-ray diffraction was used to characterize crystalline phases, lattice parameters and residual stresses with radiation depth penetration. The results showed that residual stresses and crystalline size are dependent on the glancing incident angle. No phase variation was observed with film thickness. (author)
Original Title
Determinacao da microtensao e tamanho de cristalino em filmes de Sr Ti O3 por DRX com angulo rasante
Primary Subject
Source
Associacao Brasileira de Ceramica, Sao Paulo, SP (Brazil); 465 p; 1997; p. 494-497; 41. Brazilian congress on ceramics; 41. Congresso brasileiro de ceramica; Sao Paulo, SP (Brazil); 3-6 Jun 1997; 2. Congress on ceramics and industrial minerals from MERCOSUL; 2. Congresso de ceramica e minerais industriais do MERCOSUL; Sao Paulo, SP (Brazil); 3-6 Jun 1997; Available from the library of the Brazilian Nuclear Energy Commission, Rio de Janeiro; 7 refs., 9 figs.
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Miscellaneous
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AbstractAbstract
[en] Oriented LiNbO3 thin films were prepared using a polymeric precursor solution deposited on (0001) sapphire substrate by spin coating and crystallized in a microwave oven. Crystallization of the films was carried out in a domestic microwave oven. The influence of this type of heat treatment on the film orientation was analyzed by X-ray diffraction and electron channeling patterns, which revealed epitaxial growth of films crystallized at 550 and 650 deg. C for 10 min. A microstructural study indicated that the films treated at temperatures below 600 deg. C were homogeneous and dense, and the optical properties confirmed the good quality of these films
Primary Subject
Source
S004060900300587X; Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Record Type
Journal Article
Journal
Country of publication
ALKALI METAL COMPOUNDS, APPLIANCES, COHERENT SCATTERING, CRYSTAL GROWTH METHODS, DIFFRACTION, ELECTRIC APPLIANCES, ELECTRICAL EQUIPMENT, EQUIPMENT, FILMS, NIOBIUM COMPOUNDS, OVENS, OXYGEN COMPOUNDS, PHASE TRANSFORMATIONS, PHYSICAL PROPERTIES, REFRACTORY METAL COMPOUNDS, SCATTERING, TRANSITION ELEMENT COMPOUNDS
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INIS VolumeINIS Volume
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Leite, E.R.; Zanetti, S.M.; Longo, Elson; Varela, J.
Proceedings of the 41. Brazilian congress on ceramics; 2. Congress on ceramics and industrial minerals from MERCOSUL. v. 11997
Proceedings of the 41. Brazilian congress on ceramics; 2. Congress on ceramics and industrial minerals from MERCOSUL. v. 11997
AbstractAbstract
[en] Sr Ti O3 thin films (obtained by polymeric precursors) were dip coated on Mg O (100) monocrystal substrates. After different thermal treatment at 850 deg C, these films were characterized by SEM and, through selective chemical attack, the films were detached from the substrates and characterized by TEM. The results showed that the thermal treatment and the atmosphere influence strongly the crystallization, densification and the grain size of these films. (author)
Original Title
Caracterizacao microestrutural de filmes finos de Sr Ti O3
Primary Subject
Source
Associacao Brasileira de Ceramica, Sao Paulo, SP (Brazil); 465 p; 1997; p. 31-34; 41. Brazilian congress on ceramics; 41. Congresso brasileiro de ceramica; Sao Paulo, SP (Brazil); 3-6 Jun 1997; 2. Congress on ceramics and industrial minerals from MERCOSUL; 2. Congresso de ceramica e minerais industriais do MERCOSUL; Sao Paulo, SP (Brazil); 3-6 Jun 1997; Available from the library of the Brazilian Nuclear Energy Commission, Rio de Janeiro; 7 refs., 4 figs.
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Miscellaneous
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Santos, P.W.; Zanetti, S.M.; Volanti, D.P.; Longo, E.; Varela, J.A.
Brazilian Materials Research Society (B-MRS), Rio de Janeiro, RJ (Brazil)2013
Brazilian Materials Research Society (B-MRS), Rio de Janeiro, RJ (Brazil)2013
AbstractAbstract
No abstract available
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Source
2013; 1 p; 12. Brazilian MRS meeting; Campos do Jordao, SP (Brazil); 29 Sep - 3 Oct 2013
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Araujo-Moreira, F.M.; Lisboa-Filho, P.N.; Lanfredi, A.J.C.; Ortiz, W.A.; Zanetti, S.M.; Leite, E.R.; Mombru, A.W.; Ghivelder, L.; Zhao, Y.G.; Venkatesan, V., E-mail: faraujo@df.ufscar.br2001
AbstractAbstract
[en] We report the structural, thermal and magnetic properties of superconducting PrBa2Cu3O7-δ (Pr-123). The existence of superconductivity in samples of Pr-123 is still a polemic subject. To further study this problem, we have measured thin films and high-quality polycrystalline bulk samples by following a sol-gel method, associated with heat treatment in argon atmosphere. The present results confirm the occurrence of superconductivity in Pr-123 polycrystalline and thin film samples
Primary Subject
Source
S0304885300008015; Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Record Type
Journal Article
Journal
Journal of Magnetism and Magnetic Materials; ISSN 0304-8853; ; CODEN JMMMDC; v. 226-230(1-3); p. 283-284
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AbstractAbstract
[en] Published in summary form only
Original Title
Determinacao quantitativa de fases por difratometria de raios X em cimentos de aluminato de calcio obtidos por eletrofusao
Primary Subject
Source
33. Brazilian Congress of Ceramic; Serra Negra, SP (Brazil); 28-31 May 1989
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Journal Article
Literature Type
Conference; Numerical Data
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AbstractAbstract
[en] Published in summary form only
Original Title
Refratarios de alta alumina
Primary Subject
Secondary Subject
Source
33. Brazilian Congress of Ceramic; Serra Negra, SP (Brazil); 28-31 May 1989
Record Type
Journal Article
Literature Type
Conference; Numerical Data
Journal
Country of publication
LanguageLanguage
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
Zanetti, S.M.; Franco, M.B.; Splettstoser Junior, J.; Placido, W.F.
Proceedings of the 33. Brazilian Congress of Ceramic. V. 21989
Proceedings of the 33. Brazilian Congress of Ceramic. V. 21989
AbstractAbstract
[en] The knowledge of the percentual composition of phases in calcium aluminate cements and clinkers is of great importance to foresight the behaviour of the cement and refractory concretes made thereof. There are some analytical techniques for these determinations, optical and eletronic microscopy as well as selective chemical attacks, each technique presenting its own difficulties. Using pure phases of CA, CA2, C2AS and C12A7 obtained by electrofusion in a laboratory electric are furnace, calibration curves were developed for X-ray diffratometric determination of phases. The method is very efficient for determination of CA, CA2, C2AS and ∝ - A12O3. The determination of C12A7 presents some variations due to its low concentration in electrofused clinkers. The method finds practical application in quality control of calcium aluminate cements
[pt]
O conhecimento da composicao percentual das fases presentes no clinquer e nos cimentos de aluminato de calcio e de grande importancia para a previsao do comportamento do cimento e dos concretos refratarios. Existem diferentes metodos analiticos para essas determinacoes, entre eles a microscopia otica e eletronica, bem como ataques seletivos por via umida, cada tecnica com alguma dificuldade inerente. Partindo de fases puras de CA, CA2, C2AS e C12A7 obtidas por eletrofusao em forno a arco de laboratorio, foram desenvolvidas curvas de calibracao para analise quantitativa de fase por difratometria de raios-X. O metodo mostrou-se bastante eficiente para a dosagem de CA, CA2, C2AS e ∝ - A12O3. A dosagem do C12A7 apresenta grandes variacoes devido a baixa concentracao dessa fase no clinquer eletrofundido. O metodo apresenta aplicacoes praticas no controle da qualidade de cimentos de aluminato de calcioOriginal Title
Determinacao quantitativa de fases por difratometria de raios X em cimentos de aluminato de calcio obtidos por eletrofusao
Primary Subject
Source
Associacao Brasileira de Ceramica, Sao Paulo, SP (Brazil); 554 p; 1989; p. 760-773; 33. Brazilian Congress of Ceramic; Serra Negra, SP (Brazil); 28-31 May 1989; Available from the Library of the Comissao Nacional de Energia Nuclear, RJ, Brazil
Record Type
Miscellaneous
Literature Type
Conference; Numerical Data
Country of publication
LanguageLanguage
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INIS VolumeINIS Volume
INIS IssueINIS Issue
AbstractAbstract
[en] The identification of corrosive agents and corrosion mechanisms is necessary to increase the furnaces campaign. Silica refractories installed in 'Santa Marina' glass furnace crown were studied. X-ray fluorescence technique was used to determine the corrosive agents diffusion, which are present in the furnace atmosphere, leading to the formation of low melting temperature phases, causing the matrix glassing. Another interesting aspect was observed in the iron oxide/refractories color relation, according to its deepness. Hg porosimetry and X-ray Diffraction were also used to evaluate the microstructural variation and phase changes. (author)
Original Title
Determinacao do perfil de difusao de oxido de sodio em refratarios de silica em fornos de fusao de vidro
Primary Subject
Source
40. Brazilian congress on ceramics; 40. congresso brasileiro de ceramica; Criciuma, SC (Brazil); 12-15 Jun 1996; 1. Congress on ceramics of MERCOSUL; 1. Congresso de ceramica do MERCOSUL; Criciuma, SC (Brazil); 12-15 Jun 1996; 2 refs., 7 figs.
Record Type
Journal Article
Literature Type
Conference
Journal
Ceramica; ISSN 0366-6913; ; v. 42(276); p. 368-371
Country of publication
CHALCOGENIDES, CHEMICAL ANALYSIS, CHEMICAL REACTIONS, COHERENT SCATTERING, CRYSTAL STRUCTURE, DIFFRACTION, ELEMENTS, IRON COMPOUNDS, NONDESTRUCTIVE ANALYSIS, NONMETALS, OXIDATION, OXIDES, OXYGEN COMPOUNDS, PHASE TRANSFORMATIONS, SCATTERING, SILICON COMPOUNDS, TRANSITION ELEMENT COMPOUNDS, X-RAY EMISSION ANALYSIS
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