[en] We present an analysis of the mechanical properties of transparent conducting oxide (TCO), indium tin oxide (ITO) and indium zinc oxide (IZO) thin films on the glass substrates. The thin films of ITO and IZO were deposited by radio frequency magnetron sputtering at a low processing temperature. The elastic modulus and hardness of the TCO films prepared at different deposition conditions are determined by nano-indentation experiments. The results show that the presence of hydrogen in a gas mixture during film deposition could vary significantly the hardness and elastic modulus of the ITO films. However, the hardness and elastic modulus of IZO films prepared at the similar conditions are found to be less sensitive to the hydrogen used in the film deposition. The correlation between elastic moduli and the porosity in ceramic materials is used to determine the porosity of the TCO films thus prepared. It is found that the porosity of the ITO films can be changed approximately by 9%, when the films are prepared in the presence of hydrogen in the gas mixture

[en] Secondary ion mass spectroscopy is used to examine the dark, non-emissive defects on the organic light emitting device. Boundary movements are originated from electrode imperfection. Due to flexibility and movability of polymer layer, distribution variations and a more severe indium and calcium overlapping are detected in dark spot defect area. Boundary movements are not in good agreement between different layers. Interfaces became undulate. The closeness and proximity between the In sharp spikes and cathode metal protrusion leads to the initial point of dark spot. We demonstrate that the presence of cathode imperfection and interface roughness of different layers correlated to the device dark spot formation

[en] The degradation in electroluminescence of poly(p-phenylene vinylene)-based organic light-emitting devices is studied using optical microscopy, scanning electron microscopy, and secondary ion mass spectroscopy. 'Bubbles' are formed at the polymer and indium tin oxide interface or in the polymer layer within the nonemissive area. This formation, which occurs during device electrical stress, is accompanied by a fluctuation of the device current. The bubbles are formed by the degraded polymer and/or the gas released from disintegration of the polymer. High local current density flowing near the dark spot center and the resultant heating, decomposes the polymer layer. The resultant carbonized area causes either local short circuit and/or open circuit leading to the final light-emitting device failure