[en] Total ionizing dose hardening of commercial FPGAs for space applications is presented briefly. Total ionizing dose effects of Actel anti-fuse FPGAs are analysed in detail, including effects of fabrication technologies, bias condition and charge pump. The results show that degradation of the internal charge pump is a key factor in severe degradation of the systems. It is vitally important that radiation testing should include special measurements of start-up transients. Lastly, available hardening techniques are discussed

[en] The characteristics' degradation and X-ray enhancement effects of N80C196KC20 chips were presented. The X-ray and ⁶⁰Co irradiations of N80C196KC20 chips from Intel Company were performed to investigate the response of operating currents I_cc. The operation failure symbolizes the total dose response of the chips. The total dose failure level of the chips is very low, and the γ total dose failure is about 165 Gy(Si). The operating current of the chip increases significantly when failure of the chip happens. The X-ray enhanced factor of N80C196KC20 chip is measured and the X-ray enhancement mechanism is studied. (authors)