Characteristic X-ray yield from atoms excited by . channeling protons
Kosse, A.I.; Neshov, F.G.; Puzanov, A.A.
Proceedings of 10. All-union conference on physics of charged particles interaction with crystals. Part 21981
Proceedings of 10. All-union conference on physics of charged particles interaction with crystals. Part 21981
AbstractAbstract
[en] The yield of characteristic LX-rays (CLX) of W atoms excited by channeling protons is studied. A proton beam with the initial energy of 0.6 MeV was used. The angles between the beam direction and detection directions of CLX and backscattered protons (BP) were 120 and 135 deg respectively. Four line - l, α, β, γ - were singled out from the L-radiation spectrum. The angular distributions of CLX and BP were measured. The difference between them resulted only from the integral character of the CLX yield (for the experiment conditions the probability of L-shell-ionization by channeling particles tended to zero and thus the CLX yield was conditioned only by dechanneling particles). The change of the relative intensities of the Lsub(α) and Lsub(β) lines in the dependence of crystal orientation relative to the (111) axis was considered. The formula for the mean generation depth of CLX has been derived which also is valid for channeling
Original Title
Vykhod kharakteristicheskogo rentgenovskogo izlucheniya atomov, vozbuzhdaemykh kanalirovannymi protonami
Source
AN SSSR, Moscow; Ministerstvo Vysshego i Srednego Spetsial'nogo Obrazovaniya SSSR, Moscow; Moskovskij Gosudarstvennyj Univ. (USSR). Nauchno-Issledovatel'skij Inst. Yadernoj Fiziki; p. 392-395; 1981; p. 392-395; 10. All-union conference on physics of charged particles interaction with crystals; Moscow, USSR; 28 - 30 May 1979; 2 refs.; 2 figs.
Record Type
Miscellaneous
Literature Type
Conference
Report Number
Country of publication
Descriptors (DEI)
Descriptors (DEC)
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue