Diverging characteristic lengths at critical disorder in thin-film superconductors
AbstractAbstract
[en] The characteristic lengths associated with the flux-flow resistance and critical fields measured at the vortex-antivortex transition temperature of thin-film InInO/sub x/ composites have been found to be approximately equal and to diverge simultaneously near critical disorder where superconductivity disappears. The observed disorder-induced enhancement of the vortex mobility cannot be explained by the dirty-limit formula for the coherence length when used within the context of the Bardeen-Stephen description for vortex dissipation
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Journal Article
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Numerical Data
Journal
Physical Review Letters; ISSN 0031-9007; ; v. 54(19); p. 2155-2158
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