[en] Structural modifications of Al thin films implanted with Mn ions at room temperature have been studied using a two-circle X-ray powder diffractometer. The method of X-ray line profile analysis was used to determine the strain. As a consequence of ion bombardment, the Al lattice undergoes distortions. The maximum value of the atomic displacement U_st was found to be 0.14±0.01 A, and the maximum value of the r.m.s. strain was (1.05±0.15) x 10^-3. The lattice constant a₀ of Al was found to decrease by about 0.12 at.%. (author)