Electro-optic properties of (Pb,La) (Zr,Ti)O3, BaTiO3 (Sb,Ba)(Nb2O6) and Ba2NaNb5O15 thin films by a confocal scanning differential polarization microscope
[en] The non-linearities in the electrooptic properties of rf magnetron sputter-deposited PLZT, BaTiO3, SBN, and BNN films on fused silica substrates have been studied using a high spatial resolution transmission confocal optical polarization microscope. By applying electric fields to the films, Pockels, Kerr and higher order electrooptic coefficients in the films with the spot size as small as 0.4 μm in diameter were determined. The experimental results are presented and the fundamental materials and physical properties of the films are discussed
Source
Allred, R.E.; Martinez, R.J.; Wischmann, K.B; 859 p; ISBN 0-938994-53-0; 
; 1990; p. 712-721; SAMPE; Covina, CA (USA); 4. international SAMPE electronic materials and processes conference; Albuquerque, NM (USA); 12-14 Jun 1990; CONF-9006121--; SAMPE, 843 West Glentana, P.O. Box 2459, Covina, CA 91722 (USA)
; 1990; p. 712-721; SAMPE; Covina, CA (USA); 4. international SAMPE electronic materials and processes conference; Albuquerque, NM (USA); 12-14 Jun 1990; CONF-9006121--; SAMPE, 843 West Glentana, P.O. Box 2459, Covina, CA 91722 (USA)