Measurement of the K X-ray absorption jump ratio of erbium by attenuation of a Compton peak
AbstractAbstract
[en] The X-ray absorption jump ratio of erbium was measured with a high resolution intrinsic germanium detector by attenuation, with an erbium foi, of a Compton peak produced by the scattering of the 60 keV americium 241 X-rays. Data analysis consists of a deconvolution to find the true Compton peak shape and an integration of a parameterized expression of the attenuation coefficient adjusted by least squares. Our result has an error of 1.5% and compared with calculated data shows a difference of less than 5%. PACS number(s): 32.80 Fb, 32.80 Cy. (author)
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Journal Article
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Numerical Data
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BASIC INTERACTIONS, DATA, ELASTIC SCATTERING, ELECTROMAGNETIC INTERACTIONS, ELECTROMAGNETIC RADIATION, ELECTRONIC STRUCTURE, ELEMENTS, ENERGY RANGE, GE SEMICONDUCTOR DETECTORS, INFORMATION, INTERACTIONS, IONIZING RADIATIONS, KEV RANGE, MEASURING INSTRUMENTS, METALS, NUMERICAL DATA, RADIATION DETECTORS, RADIATIONS, RARE EARTHS, SCATTERING, SEMICONDUCTOR DETECTORS
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