Double and single ionization of helium by 60-keV X-rays
AbstractAbstract
[en] The ratio, R, of cross sections for double and single ionization of helium induced by photons as a function of their energy is of particular interest as a measure of the relative importance of electron correlation effects. Calculations of this quantity are highly sensitive to assumptions about correlations between the two escaping electrons. At photon energies above ∼6 keV the major contributing process comes from Compton scattering. Recent theories differ widely in their predictions of an asymptotic value of R. The authors have made a measurement at a photon energy significantly higher than those explored previously. For this they chose the 60-keV x-ray beam at ID15 of the European Synchrotron Radiation Facility (ESRF) in Grenoble, France. To minimize background problems, they employed the COLTRIMS (Cold Target Recoil Ion Momentum Spectroscopy) technique and a supersonic cold jet of helium gas. Using a position-sensitive channel-plate detector and time-of-flight measurement, the authors were able to cleanly identify the He ions and determine a value of R. They discuss how this result serves to discriminate between several theoretical calculations of the asymptotic limit
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27. annual meeting of the Division of Atomic, Molecular and Optical Physics (DAMOP) of the American Physical Society (APS); Ann Arbor, MI (United States); 15-18 May 1996; CONF-9605105--
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