[en] An exit angle dependence of the intensity of carbon K_α line during proton bombardment was measured to observe the evanescent wave. A Soller type spectrometer was used to measure the intensity of X-ray lines. A mirror polished Si (1 1 1) wafer was used as a substrate and carbon was deposited onto this surface. As a result a curious exit angle dependence which is similar to the evanescent wave of X-rays was found . The calculated transmission coefficient of X-ray evanescent wave is compared with measured exit angle dependence of X-ray emission. The experimental and theoretical values are in good agreement. Utilization of this phenomenon permits to enhance the surface sensitivity of the PIXE analysis method