[en] We report on a broadband technique for making frequency-swept permeability measurements of magnetic thin films. The device is essentially a strip line short circuited to the ground plane. The measurement of the input impedance of the cell loaded with the sample is modeled appropriately with an equivalent electrical circuit and the complex permeability is deduced. The technique is applied in deducing the complex permeability of thin permalloy films deposited on Si(1 0 0) substrates in the frequency range from 200 MHz to 4 GHz