[en] Modern Synchrotrons are capable of significant per-pulse x-ray flux, and time resolved pulse-probe experiments have become feasible. These experiments provide unique demands on x-ray monitors, as the beam position, flux and arrival time all potentially need to be recorded for each x-ray pulse. Further, monitoring of white x-ray beam position and flux upstream of beamline optics is desirable as a diagnostic of the electron source and insertion device alignment. We report on diamond quadrant monitors which provide beam diagnostics for a variety of applications, for both white and monochromatic beams. These devices have a position resolution of 25 nm for a stable beam, are linear in flux over at least 11 orders of magnitude, and can resolve beam motion shot-by-shot at repetition rates up to 6.5 MHz.