[en] (La_0.7Sr_0.3MnO₃)_n(BiFeO₃)_n multilayered thin films were deposited on (0 0 1) SrTiO₃ substrates by using the RF magnetron sputtering method, and their conduction mechanisms in the temperature range between 150 K and 300 K were investigated using several common dielectric conduction models. The results indicate the current-voltage characterization of the as-fabricated thin films obey Ohm's law at 300 K, but the space-charge-limited conduction mechanism becomes dominant in the as-fabricated thin films as the temperature is decreased.