[en] Interface roughness dynamics connected with various physical processes have been studied through novel microscopic models in connection with experiments. The statistical properties of such rough interfaces appearing in wide range of physical systems are observed to belong in different universality classes characterized by the scaling exponents. With the advancement of characterization techniques, the scaling exponents of thin film surface (or the morphological evolution of amorphous surfaces eroded by ion bombardment) are easily computed even in situ during the growing (erosion) conditions. The relevant key physical parameters during the dynamics crucially control the overall scaling behavior as well as the scaling exponents. The non-universal nature of scaling exponents is emphasized on the variations of the physical parameters in experimental studies and also in theoretical models. (author)