Reliability Engineering in a Time of Rapidly Converging Technologies

Shiuhpyng Winston Shieh, Jeffrey M. Voas, Phil Laplante, Jason Rupe, Christian K. Hansen, Yu-Sung Wu, Yi-Ting Chen, Chi-Yu Li 0001, Kai-Chiang Wu. Reliability Engineering in a Time of Rapidly Converging Technologies. IEEE Transactions on Reliability, 73(1):73-82, March 2024. [doi]

Abstract

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