Last updated on Dec 19, 2024

How do you monitor and manage FPGA radiation effects and degradation over time?

Field-Programmable Gate Arrays (FPGA) are versatile and customizable devices that can perform complex functions in various applications, such as aerospace, defense, medical, and communication. However, FPGA are also susceptible to radiation-induced errors and degradation, which can compromise their reliability and performance over time. In this article, you will learn about the types and sources of radiation effects on FPGA, how to monitor and manage them, and what mitigation strategies are available.

1 Types and sources of radiation effects

Radiation effects on FPGA can be classified into two main categories: single event effects (SEE) and total ionizing dose (TID) effects. SEE are caused by energetic particles, such as protons, neutrons, or cosmic rays, that strike the FPGA and generate transient or permanent changes in its logic or memory cells. TID effects are caused by the cumulative exposure of the FPGA to ionizing radiation, such as gamma rays or X-rays, that degrade its transistors and oxide layers. Both types of radiation effects can lead to functional failures, reduced speed, increased power consumption, or reduced lifetime of the FPGA.

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Karankumar Nevage

VLSI Enthusiast | Electronics & Computer Engineer | CANSAT INDIA Finalist | SIH 2023 Winner | PCB Designer | Blog Writer | YT Creator |
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Monitoring and managing FPGA radiation effects involves several strategies. Radiation effects on FPGAs can be categorized into TID (Total Ionizing Dose) and SEEs (Single Event Effects). TID causes gradual degradation, while SEEs include Single Event Upsets and Single Event Latch-ups. In a project, we used Triple Modular Redundancy (TMR) and configuration scrubbing to handle SEUs. TMR means we made three copies of critical components and used voting to ensure they worked correctly. Configuration scrubbing regularly refreshed the FPGA setup to fix SEUs. This method greatly improved our system's reliability.

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2 How to monitor radiation effects

To monitor the radiation effects on FPGA, you need to measure the radiation dose and the error rate of the device. Radiation dose can be measured by using external sensors, such as dosimeters or radiation monitors, that record the amount and type of radiation that the FPGA is exposed to. Error rate can be measured by using internal or external testing methods, such as built-in self-test (BIST), error detection and correction (EDAC), or fault injection, that detect and count the errors that occur in the FPGA logic or memory cells. By comparing the radiation dose and the error rate, you can assess the sensitivity and vulnerability of the FPGA to radiation effects.

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3 How to manage radiation effects

To manage the radiation effects on FPGA, you need to implement corrective and preventive actions that can reduce or eliminate the errors and degradation caused by radiation. Corrective actions include using error recovery techniques, such as reset, reconfiguration, or scrubbing, that restore the FPGA to its normal state after an error occurs. Preventive actions include using design techniques, such as redundancy, hardening, or shielding, that protect the FPGA from radiation effects or increase its tolerance to errors. Depending on the application and the environment, you may need to combine different corrective and preventive actions to achieve the desired level of reliability and performance.

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4 Mitigation strategies for radiation effects

Mitigation strategies for radiation effects on FPGA are based on selecting the appropriate device, design, and testing methods that suit your application requirements and constraints. For device selection, you need to consider the radiation tolerance and the trade-offs of different FPGA types and families, such as SRAM-based, flash-based, or antifuse-based FPGA. For design methods, you need to follow the best practices and guidelines for radiation-hardened or radiation-tolerant FPGA design, such as avoiding single points of failure, minimizing critical paths, or optimizing resource utilization. For testing methods, you need to perform radiation testing and analysis at different stages of the FPGA development cycle, such as pre-design, post-design, or in-situ testing, to verify and validate the radiation performance of the FPGA.

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Jobson Nunes
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n my experience, monitoring and managing radiation effects on FPGAs requires a multifaceted approach that combines robust design, continuous monitoring, and effective mitigation strategies. Monitoring: We use integrated radiation sensors to measure the Total Ionizing Dose (TID) and internal tools, such as BIST and EDAC tests, to monitor Single Event Effects (SEEs) in real time. These methods help us identify specific vulnerabilities in the FPGA over time.

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5 Resources and references for FPGA radiation effects

If you want to learn more about FPGA radiation effects and mitigation, you can consult several resources and references, such as the FPGA Radiation Effects and Mitigation Techniques User Guide from Microchip Technology, Radiation Effects on Embedded Systems by Raoul Velazco et al., Radiation Effects in Advanced Semiconductor Materials and Devices by C. Claeys and E. Simoen, Radiation-Hardened FPGAs for Space Applications by M. Caffrey et al., or A Survey of Radiation Test Results on FPGAs by L. Sterpone et al. These can provide you with a more in-depth understanding of the topics discussed in this article.

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How do you monitor and manage FPGA radiation effects and degradation over time?

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1 Types and sources of radiation effects

2 How to monitor radiation effects

3 How to manage radiation effects

4 Mitigation strategies for radiation effects

5 Resources and references for FPGA radiation effects

Field-Programmable Gate Arrays (FPGA)

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