Bruker Nano Surfaces & Metrology

Building on 55 years of surface measurement innovation and technology leadership, Dektak Pro™ sets a new standard for stylus profilometer performance. The system uniquely delivers the highest quality data with unrivaled ease of use. ➡️ https://lnkd.in/gaMM2DbF 𝗧𝗵𝗶𝘀 𝟭𝟭𝘁𝗵-𝗴𝗲𝗻𝗲𝗿𝗮𝘁𝗶𝗼𝗻 𝗗𝗲𝗸𝘁𝗮𝗸® 𝘀𝘆𝘀𝘁𝗲𝗺 𝗰𝗼𝗺𝗯𝗶𝗻𝗲𝘀: • Unmatched accuracy and better than 4 A repeatability • Accelerated measurement and analysis speed • A suite of Bruker-exclusive versatility and ease-of-use features Only Dektak Pro provides the latest stylus profilometry advances and reliability needed to support your cutting-edge research and industrial applications well into the future. #Microelectronics #Biomaterials #thickfilms

𝗨𝘀𝗲 𝗰𝗼𝗱𝗲 𝗙𝗔𝗟𝗟𝟮𝟰 𝗮𝘁 𝗰𝗵𝗲𝗰𝗸𝗼𝘂𝘁 𝗚𝗲𝘁 𝟭𝟱% 𝗼𝗳𝗳 𝘄𝗵𝗲𝗻 𝘆𝗼𝘂 𝗯𝘂𝘆 𝟮 𝗼𝗿 𝗺𝗼𝗿𝗲 𝗽𝗮𝗰𝗸𝘀 𝗼𝗳 𝗢𝗟𝗧𝗘𝗦𝗣𝗔-𝗥𝟰 𝗼𝗿 𝗢𝗧𝗘𝗦𝗣𝗔-𝗥𝟰 Now through December 31, 2024, get 15% off when you buy 2 or more packs of OLTESPA-R4 or OTESPA-R4 visible-tip probes! 🛒 https://lnkd.in/gxWqDa-R These probes allow you to reliably target any point of interest. Just align the free end of the cantilever with the sample feature of interest when in the navigation GUI of your AFM, and hit Engage. Since the tip is located directly beneath the cantilever apex, it will land in the perfect position every time! Both probes feature tetrahedral sharpened tips with 7 nm tip radii for crisp #topographic images. OLTESPA-R4 has a 70 kHz frequency and 2 N/m spring constant, while OTESPA-R4 has a 300 kHz nominal frequency and 26 N/m spring constant, making them a perfect pairing for a wide range of polymeric, metallic, #semiconductor, ceramic, and similar samples. #AFM #materialsscience

𝗠𝗲𝘁𝗿𝗼𝗹𝗼𝗴𝘆 𝗮𝗻𝗱 𝗶𝗻𝘀𝗽𝗲𝗰𝘁𝗶𝗼𝗻 𝘁𝗲𝗰𝗵𝗻𝗶𝗾𝘂𝗲𝘀 𝗳𝗼𝗿 𝘀𝗲𝗺𝗶𝗰𝗼𝗻𝗱𝘂𝗰𝘁𝗼𝗿 𝗳𝗮𝗯𝘀 𝗺𝘂𝘀𝘁 𝗮𝗱𝗱𝗿𝗲𝘀𝘀 𝗶𝗻𝗰𝗿𝗲𝗮𝘀𝗶𝗻𝗴𝗹𝘆 𝗰𝗼𝗺𝗽𝗹𝗲𝘅 𝗶𝘀𝘀𝘂𝗲𝘀 𝗮𝘁 𝗶𝗻𝗰𝗿𝗲𝗮𝘀𝗶𝗻𝗴𝗹𝘆 𝘀𝗺𝗮𝗹𝗹𝗲𝗿 𝘀𝗰𝗮𝗹𝗲𝘀. Bruker’s John Wall (Compound Semi Business Product Manager) was quoted in the recent Semiconductor Engineering 𝘔𝘦𝘵𝘳𝘰𝘭𝘰𝘨𝘺 𝘈𝘥𝘷𝘢𝘯𝘤𝘦𝘴 𝘚𝘵𝘦𝘱 𝘜𝘱 𝘛𝘰 𝘚𝘶𝘣-2𝘯𝘮 𝘋𝘦𝘷𝘪𝘤𝘦 𝘕𝘰𝘥𝘦 𝘕𝘦𝘦𝘥𝘴: “… the [X-ray diffraction imaging] XRDI technique can detect cracks, edge defects, and multiple problems that can cause the device to fail catastrophically during the back-end process and before packaging.” Samuel Lesko (Senior Director and General Manager of Bruker’s TSOM Business) added that Bruker’s white-light interferometry tools have become a vital and integrated part of the manufacturing process flow for our customers in advanced 2.5D packaging. 📃 Read the full article: https://lnkd.in/g2ncjNxx #semiconductors #Metrology #SemiconductorIndustry

𝗦𝗰𝗶𝗲𝗻𝘁𝗶𝗳𝗶𝗰 𝗮𝗱𝘃𝗮𝗻𝗰𝗲𝗺𝗲𝗻𝘁𝘀 𝗼𝗳𝘁𝗲𝗻 𝗿𝗲𝗾𝘂𝗶𝗿𝗲 𝗰𝗼𝗹𝗹𝗮𝗯𝗼𝗿𝗮𝘁𝗶𝗼𝗻 𝘄𝗶𝘁𝗵 𝗶𝗻𝗱𝘂𝘀𝘁𝗿𝘆, 𝗮𝗰𝗮𝗱𝗲𝗺𝗶𝗮, 𝗮𝗻𝗱 𝘀𝗼𝗰𝗶𝗲𝘁𝘆. 🦠 Our research highlight with Dr. David Martínez Martín features his work in the lab at the University of Sydney and with other stakeholders to improve and develop nanotechnologies supporting key topics such as the behavior of yeast cells and their impact on the medical field. 🔬 David is an innovator with 19 patents and 17 of them licensed or assigned to industry. These technologies and techniques include an atomic force microscope coupled to a widefield microscope, or picobalance—a technique that allows the real-time and highly-accurate measurement of alive cells. 📑 Give the full highlight a read to learn more about the samples and dynamic processes his lab regularly observes using a variety of approaches. Let us know what you find most interesting! #AFM #biomedical #engineering #microscopy

Don’t miss tomorrow's webinar on using Automated AFM for the non-destructive, inline process control of hybrid bonding in the semiconductor industry. Register today 👉 https://lnkd.in/g7x-ghvW Automated AFM can be applied in the most current hybrid bonding technology nodes and wafer processing steps. This webinar will outline: • Key features for process control in high volume manufacturing of bonded wafers • High resolution imaging and analysis for critical bond pad metrology • Large-area scanning of areas of up to 100s of mm2 of wafer-to-wafer bonding • Automated bevel edge metrology for hybrid bonding • Patterned and bare/blanket wafer defect review Don’t miss the Q&A session with the team: Sean Hand and Ingo Schmitz! Bruker’s fully automated AFM solutions enable the highly accurate, nanoscale characterization of surfaces. It delivers high-throughput data for inline process control and actionable data for hybrid bonding yield enhancement, and is ideal for labs and fabs working on new bonding device design. #automation #semiconductorindustry #qualitycontrol #afm

Join us at this FREE workshop on the nanoscale characterization of advanced materials, which we are holding in collaboration with The University of Huddersfield . To register 👉 https://lnkd.in/gKEW6kWj Our special guest speakers are Dr. Josh Armitage, University of Leeds, and Prof. Liam Blunt, Dpt. of Engineering, University of Huddersfield. Have your sample measured in the practical sessions on the ContourX-500 profilometer and UMT TriboLab mechanical testing systems! Don’t miss the chance to learn about: * The latest developments and advanced materials characterization using nanoindentation, 3D optical profiling, and tribology techniques * Applications ranging from precision engineering to the characterization of MEMS, sensors, and orthopedics, as well as scratch and lubricant testing. Discuss your applications with the team: Mohamadou Diew, PhD, Dr. Peter Schön, Penelope Downes (Livesey), and Boumedienne Boudjelida. #qualityassurance #nanotechnology #metrology #lubricants

🚨TODAY🚨 𝗖𝘂𝗿𝗿𝗲𝗻𝘁 𝗮𝗰𝗿𝗼𝘀𝘀 𝗮 𝗰𝗼𝗻𝘁𝗮𝗰𝘁 𝗰𝗮𝗻 𝗴𝗲𝗻𝗲𝗿𝗮𝘁𝗲 𝗵𝗲𝗮𝘁, 𝗰𝗵𝗮𝗻𝗴𝗲 𝗽𝗿𝗼𝗽𝗲𝗿𝘁𝗶𝗲𝘀, 𝗮𝗻𝗱 𝗱𝗮𝗺𝗮𝗴𝗲 𝘀𝘂𝗿𝗳𝗮𝗰𝗲𝘀 Register today ➡️ https://lnkd.in/gEaptfYy In this webinar, guest speaker Prof. Jackson will present his work on numerical models of mixed-lubrication cases that incorporate coupled #electromagnetic, solid, and fluid mechanics solutions as well as effects from roughness. This comprehensive approach can result in models that are powerful analytical and predictive tools for applications where contacts can be electrified, such as electric vehicles, power generation, and spacecraft. 𝗝𝗼𝗶𝗻 𝘂𝘀 𝗳𝗼𝗿 𝘁𝗵𝗶𝘀 𝘄𝗲𝗯𝗶𝗻𝗮𝗿 𝘁𝗼 𝗹𝗲𝗮𝗿𝗻: • The relevance of effective friction, wear, and lubrication (tribology) practices, and how surface roughness can be an important factor • What changes and new considerations arise when an electrical current is introduced across the contacts • How numerical models can be built to address the factors of added electrical current and multi-length-scale surface roughness 𝗪𝗲𝗯𝗶𝗻𝗮𝗿 𝗦𝗽𝗲𝗮𝗸𝗲𝗿 📣 Robert L. Jackson, Ph.D. Professor of Mechanical Engineering Auburn University #EVs #tribology #Friction

🔔 𝗡𝗮𝗻𝗼𝗯𝗿𝘂𝗰𝗸𝗲𝗻 𝟮𝟬𝟮𝟱: 𝗥𝗲𝗴𝗶𝘀𝘁𝗿𝗮𝘁𝗶𝗼𝗻 𝗮𝗻𝗱 𝗮𝗯𝘀𝘁𝗿𝗮𝗰𝘁 𝘀𝘂𝗯𝗺𝗶𝘀𝘀𝗶𝗼𝗻 𝗻𝗼𝘄 𝗼𝗽𝗲𝗻! To register and submit an abstract, please visit ▶️ https://lnkd.in/gZbKB_4H Nanobrücken 2025 will take place in Halle (Saale), Germany. Our kind host is the Fraunhofer Institute for Microstructure of Materials and Systems IMWS. Nanobrücken is Bruker’s annual conference on nanomechanical and nanotribological testing. It brings together top international researchers and industrial leaders for talks on the latest state-of-the art developments in metrology, live demos, and ample opportunities to network with peers and the Bruker team: Rhys Jones, Ude Hangen, Jaroslav Lukeš, Oden Warren, and Douglas Stauffer. Topics include: • Advanced nanoindentation and associated techniques • Testing in extreme environments • In-situ SEM/TEM, theory/simulation and biomechanical testing 𝗔𝗯𝘀𝘁𝗿𝗮𝗰𝘁 𝗦𝘂𝗯𝗺𝗶𝘀𝘀𝗶𝗼𝗻 - 𝗗𝗲𝗮𝗱𝗹𝗶𝗻𝗲 𝗶𝘀 𝗝𝗮𝗻𝘂𝗮𝗿𝘆 𝟭𝟳𝘁𝗵 We hope to see you there! Fraunhofer Institute for Microstructure of Materials and Systems IMWS Fraunhofer-Gesellschaft #nanotechnology #materialscience #qualityassurance

🚨TODAY🚨 𝗗𝗶𝘀𝗰𝗼𝘃𝗲𝗿 𝗿𝗲𝗰𝗲𝗻𝘁 𝗮𝗱𝘃𝗮𝗻𝗰𝗲𝘀 𝗶𝗻 𝗻𝗮𝗻𝗼𝗺𝗲𝗰𝗵𝗮𝗻𝗶𝗰𝘀 𝘁𝗲𝘀𝘁𝗶𝗻𝗴 𝗶𝗻𝘀𝗶𝗱𝗲 𝗮 𝘀𝗰𝗮𝗻𝗻𝗶𝗻𝗴 𝗲𝗹𝗲𝗰𝘁𝗿𝗼𝗻 𝗺𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝗲 Register ➡️ https://lnkd.in/grHjfDz3 In this webinar, presenters will cover recent advances in in-situ nanomechanics testing, highlighting a case study on fracture toughness in nitride hard coatings. They will also introduce the PI 89 Auto PicoIndenter—which automates nanoindentation mapping for correlating microstructure with #mechanical properties—and explore processing-structure-mechanical property relationships using this high-throughput in-situ system. 𝗝𝗼𝗶𝗻 𝘂𝘀 𝗳𝗼𝗿 𝘁𝗵𝗶𝘀 𝘄𝗲𝗯𝗶𝗻𝗮𝗿 𝘁𝗼 𝘀𝗲𝗲: • Research on the influence of columnar grain boundaries on the fracture toughness of nitride hard coatings, determined using in-situ SEM microcantilever fracture tests • An introduction to the PI 89 Auto PicoIndenter for streamlined correlation of microstructure and mechanical properties • Evaluation of processing-structure-property relationships in structural materials as determined using PI 89 Auto to correlate EBSD, EDS, and nanoindentation maps 𝗪𝗲𝗯𝗶𝗻𝗮𝗿 𝗦𝗽𝗲𝗮𝗸𝗲𝗿𝘀 📣 Subin Lee, Ph.D. Group leader, Applied Materials Karlsruhe Institute of Technology 📣 Kevin Schmalbach, Ph.D. Instrumentation Scientist, Nanoindentation Unit Bruker #materialstesting #webinar

𝗟𝗲𝗮𝗿𝗻 𝘁𝗵𝗲 𝘄𝗼𝗿𝗸𝗶𝗻𝗴 𝗽𝗿𝗶𝗻𝗰𝗶𝗽𝗹𝗲𝘀, 𝗯𝗲𝗻𝗲𝗳𝗶𝘁𝘀, 𝗮𝗻𝗱 𝗶𝗱𝗲𝗮𝗹 𝗮𝗽𝗽𝗹𝗶𝗰𝗮𝘁𝗶𝗼𝗻𝘀 𝗼𝗳 𝗔𝗙𝗠-𝗜𝗥 𝗳𝗼𝗿 𝗻𝗮𝗻𝗼𝗰𝗵𝗲𝗺𝗶𝗰𝗮𝗹 𝗰𝗵𝗮𝗿𝗮𝗰𝘁𝗲𝗿𝗶𝘇𝗮𝘁𝗶𝗼𝗻 WATCH: https://lnkd.in/gQQU_KHN In this webinar, Bruker experts: • Introduce the photothermal AFM-IR technique • Explore the simple mechanism underlying the technique • Highlight a few of AFM-IR’s many broad applications • Demo photothermal AFM-IR on the Dimension IconIR system In the below clip, Cassandra Phillips, Senior Product Manager, Nanoscale IR Spectroscopy, explains how AFM-IR combines the spatial resolution of AFM with the chemical analysis capability of FTIR. #materialsscience #nanotechnology #Spectroscopy