Advanced Optical Technologies, Inc’s Post

AOT is awarded the first patent covering the CrystalView microscope, US patent 11867891. CrystalView is the only patented laser polarized-light microscope (PLM) developed for quantitative large-area microstructure characterization, featuring a 2.3 sq. cm instant field-of-view. CrystalView offers the fastest imaging - 20 minutes including processing - and higher contrast than electron backscatter diffraction (EBSD) without the use of CI filtering. CrystalView’s fundamentally new design significantly outperforms computational add-on PLMs in terms of field-of-view, speed, material diversity, and surface tolerance. CrystalView’s horizontal configuration also supports in-situ testing. CrystalView is the true high-throughput microscope for material research and production facilities. #CrystalViewmicroscope #PLM #EBSD #MicrotextureAnalysis #3DPrinting #Microstructure #Microtexture #OrientationImaging #FailureAnalysis #CAxisImaging #RapidAnalysis #QualityContol #additivemanufacturing #Metallurgy #metallography #Ti #Zr #SS316L #AlSi10Mg #In625 #C103

  • AOT is awarded the first patent covering the CrystalView microscope, US patent 11867891. CrystalView is the only patented laser polarized-light microscope (PLM) developed for quantitative large-area microstructure characterization, featuring a 2.3 sq. cm instant field-of-view. CrystalView offers the fastest imaging - 20 minutes including processing - and higher contrast than electron backscatter diffraction (EBSD) without the use of CI filtering. CrystalView’s fundamentally new design significantly outperforms computational add-on PLMs in terms of field-of-view, speed, material diversity, and surface tolerance. CrystalView’s horizontal configuration also supports in-situ testing.  CrystalView is the true high-throughput microscope for material research and production facilities.

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