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New Application Note: Off-the-Shelf finFET Device Characterization by APT In a groundbreaking study, researchers utilized Atom Probe Tomography (APT) to uncover nanoscale dopant non-uniformity and clustering in Snapdragon X70 finFET devices. This research highlights APT's ability to deliver unparalleled compositional insights into advanced semiconductor architectures, such as finFETs, nanosheets, and nanowires, helping to address manufacturing challenges in next-generation devices. Explore the full application note to learn more about these cutting-edge advancements: https://lnkd.in/e8ED8KXy

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