Chicago Pixels Max Malder’s Post

In our latest preprint "On the origin of epitaxial r-B4C growth by #CVDep on 4H-SiC" Sachin Sharma uses analytical transmission electron microscopy with the help of Justinas Palisaitis and Per Persson, to try to understand why we get epitaxy of r-B4C on the C-face of 4H-SiC, i.e., the (000-1) side, but not on the Si-face, i.e, the (0001) side. We find no interlayers or interface roughness for either. Therefore we argue that the lower surface energy of the C-face is likely the explanation for the epitaxy. https://lnkd.in/dqivpJYa

Really happy to see this finally out! "impact factors 3.06" we report the successful synthesis of Ni-doped ZnS nanocomposite via a green route using ethanolic crude extract of Avena fatua. The as-synthesized nanocomposite was comprehensively characterized using Dynamic light scattering (DLS), Zeta potential, scanning electron microscopy (SEM), Transmission electron microscopy (TEM), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), Fourier transform infrared spectroscopy (FTIR), and Atomic force microscopy (AFM). These analyses provided detailed insights into the size, morphology, composition, surface properties, and structural characteristics of the nanocomposite.  you can find the full article by using this link; https://lnkd.in/gCHqTMar

Next up in our ‘Shape Matters’ series. it is important to understand how we characterize #shaped #nanoparticles, since the methods reveal important information about the visual and crystallographic shape. Characterization of shaped nanoparticles involves both the visualization of the nanoparticles and the characterization of the atomic crystal structure to ensure that the particles have the same crystal structure throughout. Visualization is typically performed with electron microscopy, such as scanning electron microscopy (SEM) for larger particles and transmission electron microscopy (TEM) for small particles. To characterize the crystal structure, it is common to use diffraction techniques such as x-ray diffraction analysis (XRD) or selected area electron diffraction (SAED) to identify the different atomic facets or planes to identify the shape of the particle. At NanoScientifica, we are happy to present TEM images of all our nanoparticles, shaped or spherical, as part of our standard analysis methods. We are also happy to include XRD of our shaped nanoparticles when specified. An example of Gold nanoparticles on Carbon can be found here: https://lnkd.in/dN83EgQu An example of Palladium Cubes can be found here https://lnkd.in/dB4evS7h References: Stefan Wuttke et al. https://lnkd.in/dWEsBrdT Simona Hunyadi Murph, Ph.D. et al. https://lnkd.in/drGyuCUG

Multi-component systems, especially at the nanoscale are fascinating. These systems exhibit an interplay of rich physical phenomenon. Here is an example showing surface segregation, d0 magnetism and it's quenching in Bismuth Ferrite nanoparticles. We leveraged Scanning Electron Microscopy, Magnetometry along with X-ray Photoemission Spectroscopy to unravel this rich interplay. Read at a preprint server near you. https://lnkd.in/g2ZrG9_a

Atomic Force Microscopy (AFM) is an extraordinary tool for mapping intermolecular forces, characterizing mechanical properties, and generating high-resolution 3D surface profiles across disciplines. However, achieving accurate AFM results requires impeccable surface cleanliness and precise chemical preparation. Plasma cleaning is an essential step in this process, removing contaminants and optimizing surface chemistry to improve adhesion and reproducibility. Whether you're investigating nanoscale materials or manipulating substrates, Harrick Plasma cleaners help with AFM workflows to achieve exceptional precision. Learn more about plasma’s role in AFM: https://lnkd.in/edHVe-n9 #PlasmaCleaning #AtomicForceMicroscopy #Nanotechnology #SurfaceScience

FAQ of Scanning Electron Microscope (SEM) ： 1. Does the magnetic nature of a specimen affect SEM testing? 2. What are the effects of radioactive specimens on SEM testing? 3. Is specimen stability important for SEM testing? 4. Why can't Energy Dispersive Spectrometer (EDS) in SEM provide accurate quantification? 5. What is a back-scattered electron image? ...... Learn more: https://lnkd.in/giyC6Fuh #ElectronMicroscope #CIQTEK #SEMmicroscope

Refurbished Leica Microsystems DMLSP polarized upright compound microscope is on its way to a materials lab. Featuring a rotating stage, analyzer, polarizer, and polarization objectives, this microscope is fully equipped for advanced quantitative polarization microscopy. Find out more at https://lnkd.in/epxnwcFN #Microscope #Microscopy #Polarization

Precision surface prep is made possible with Harrick Plasma tools...

Application note for the Fischione Instruments Model 1080 PicoMill® TEM specimen preparation system: Ex situ lift-out specimen thinning, Ar ion milling of specimens on carbon support grids - https://lnkd.in/etH4P54B The PicoMill system's scanning transmission electron microscope (STEM) detector images of EXLO specimens from a 20 nm NAND solid-state drive device. Before (first row, left) and after (first row, right) concentrated Ar ion beam milling images show an intact specimen while parts of the perforated carbon support were milled off. Bright-field TEM imaging before (second row, left) and after (second row, right) Ar ion milling reveals a reduction of curtaining (blue arrows) and removal of sputtered material (yellow arrows). Find out more about the Fischione Instruments products and our other Electron Microscopy product lines - https://lnkd.in/g8MjTp8u #TEM #SamplePrep #IonMilling #STEM #Imaging #ElectronMicroscopy #ArIonMilling

#GrapheneElectronMicroscopeSupportFilm Graphene electron microscope support film is an upgraded solution for cryo-electron microscopy (cryo-EM) sample preparation. By introducing a high-quality, single-crystal graphene thin film with a single atomic layer thickness onto the surface of a traditional grid, it effectively supports samples such as biological macromolecules, single atoms, and nanoparticles. The graphene support film has virtually no background noise, effectively mitigating issues such as gas-liquid interface, preferred orientation, uneven ice layers, and sample displacement. This improves imaging contrast, enriches sample concentration, and makes it easier for users to achieve high-resolution imaging and structural analysis. info@graphenerich.com https://lnkd.in/grwBA-mA