EIRMA - European Industrial Research Management Association’s Post

EIRMA ANNUAL CONFERENCE 2024 - OUTCOME: EIRMA - European Industrial Research Management Association, is delighted to conclude its successful Annual Conference 2024 - hosted by Bekaert in Brussels last week - on the current and challenging topic: "𝗘𝗨 𝗜𝗡𝗗𝗨𝗦𝗧𝗥𝗜𝗔𝗟 𝗥𝗘𝗦𝗜𝗟𝗜𝗘𝗡𝗖𝗘 : 𝗜𝗡𝗡𝗢𝗩𝗔𝗧𝗜𝗢𝗡 𝗙𝗢𝗥 𝗥𝗘𝗡𝗘𝗪𝗘𝗗 𝗘𝗨𝗥𝗢𝗣𝗘𝗔𝗡 𝗖𝗢𝗠𝗣𝗘𝗧𝗜𝗧𝗜𝗩𝗘𝗡𝗘𝗦𝗦", in association with the European Commission Innovation Council and the OECD-OCDE. The event included an exclusive insight on future technologies impact on society by the Quantitative Futurist Amy Webb. EIRMA praises all participants that contributed to an outstanding event result: Ernst Lutz - Bekaert/EIRMA Walter Steinlin - Swisscom Léopold Demiddeleer - TechBridgeOne s.p.r.l Carlos Haertel - EIRMA Isidro Laso - EIC Marek Novotny - ComAp Filipp Taratynov - ASML Raphael H Cohen - Management Boosters Antoinette Hodes - Check Point Roy Pennings - CERN Fernanda Bicalho - JEE Patrick Corsi - Cayak-InnoV SAS Cristina Vicini - EIC Jens Lundsgaard - OECD Hanna Paschke - JEE Alberto Messeri - JEE Christopher Andrew Dirdal - CERN Anna Ferrer Vaquer, PhD - IBEC Yves Van Rompaey - Umicore Karima Boucherka - Air Liquide Monica Schofield - TuTech Innovation Gmbh D.Michel Judkiewicz - EIRMA Matthias Kaiserswerth - IBM Research Daniel Canter - ASML Phil Webster - AD Little Richard Granger Iza Kielichowska - VITO Marcel Van de Voorde - Max Planck Institut für Metallforschung We find comfort in the certainty that EIRMA's legacy will perdure through european industry future innovation endeavours.

  • No alternative text description for this image
Carlos Haertel

Senior Industry & Investment Advisor

1mo

Thanks again to the whole EIRMA team in Brussels for putting together an excellent and varied programme, for the smooth organisation and for choosing a very special venue for our conference dinner! I've thoroughly enjoyed the 2 days.

A very inspiring discussion. thank you for the invitation and I look forward to more!

Like
Reply
See more comments

To view or add a comment, sign in

Explore topics