Srinath Venkatesan’s Post

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Director, Non-Volatile Memory R&D at Micron Technology

I am sharing the paper that my team presented in the IEEE WMED 2024 conference, which discusses the NAND cell reliability improvements through high temperature processing, enabled by advanced interconnect technology. This paper also briefly discusses the associated device mechanisms and trade-offs. #ieee #wmed2024 #3DNAND #flashmemory #micron #semiconductor Marc Aoulaiche , Donghwa Lee, Seeraz Nawaz https://lnkd.in/gtnbigjB

A Study of the Effects of Thermal Budget on 3D-NAND Charge Trap Cell Reliability

A Study of the Effects of Thermal Budget on 3D-NAND Charge Trap Cell Reliability

ieeexplore.ieee.org

Lei Wang

Leadership Keynote Speaker | Executive Coach 🎤 Elevating Executives and Teams to Next-Level Leadership 🌟 Resilience, Strategic Leadership, Team Building 🏆 First Asian Woman to Complete the Explorers Grand Slam

6mo

That sounds like some serious innovation in the semiconductor world! How did your team come up with such cutting-edge ideas?

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