VIEW Micro Metrology’s Post

🎵 Oh, the weather outside is frightful! But the #chips in Santa’s toys are delightful! When his #measurement ran too slow, he got strobe, he got strobe, he got strobe! 🎄 ⛄ 🎄 ⛄🎄 ⛄🎄 ⛄🎄 ⛄🎄 ⛄🎄 ⛄🎄 ⛄🎄 ⛄🎄 When it comes to measuring chips, fan-out packaging, probe cards, showerheads, MEMS, and other components in #semiconductor manufacturing, everybody knows VIEW Micro Metrology solutions are both accurate and FAST. Continuous Image Capture (CIC) – also known as “strobing” - is just one of several proprietary VIEW technologies that can substantially increase production throughput. Read more about CIC at https://lnkd.in/gC7cvkFE, and enjoy your holidays!

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