|
[1]
|
Studies on the Impedance Characteristics, Dielectric Relaxation, and ac Conductivity in Silicon Oxycarbide (SiOxCy:H) Films at the Amorphous-to-Nanocrystalline Transition Zone
ACS Applied Electronic Materials,
2022
DOI:10.1021/acsaelm.2c00543
|
|
|
|
|
[2]
|
Spectroscopic studies of low-temperature synthesized nanocrystalline silicon oxy-carbide thin films
Materials Today: Proceedings,
2022
DOI:10.1016/j.matpr.2022.02.380
|
|
|
|
|
[3]
|
Spectroscopic studies of low-temperature synthesized nanocrystalline silicon oxy-carbide thin films
Materials Today: Proceedings,
2022
DOI:10.1016/j.matpr.2022.02.380
|
|
|
|
|
[4]
|
Studies on the Impedance Characteristics, Dielectric Relaxation, and ac Conductivity in Silicon Oxycarbide (SiOxCy:H) Films at the Amorphous-to-Nanocrystalline Transition Zone
ACS Applied Electronic Materials,
2022
DOI:10.1021/acsaelm.2c00543
|
|
|
|
|
[5]
|
Spectroscopic studies of low-temperature synthesized nanocrystalline silicon oxy-carbide thin films
Materials Today: Proceedings,
2022
DOI:10.1016/j.matpr.2022.02.380
|
|
|
|
|
[6]
|
Frequency and temperature dependent electrical characteristics of P-doped nc-SiOX:H thin films
Materials Science and Engineering: B,
2021
DOI:10.1016/j.mseb.2021.115361
|
|
|
|
|
[7]
|
Complex Dielectric Characteristics, ac-Conductivity, and Impedance Spectroscopy of B-Doped nc-SiOX:H Thin Films
ACS Applied Electronic Materials,
2021
DOI:10.1021/acsaelm.0c01110
|
|
|
|
|
[8]
|
Frequency and temperature dependent electrical characteristics of P-doped nc-SiOX:H thin films
Materials Science and Engineering: B,
2021
DOI:10.1016/j.mseb.2021.115361
|
|
|
|
|
[9]
|
Complex Dielectric Characteristics, ac-Conductivity, and Impedance Spectroscopy of B-Doped nc-SiOX:H Thin Films
ACS Applied Electronic Materials,
2021
DOI:10.1021/acsaelm.0c01110
|
|
|
|
|
[10]
|
Alternating current impedance spectroscopic investigation of an a-Si:H/c-Si heterojunction with porous silicon multilayers
Thin Solid Films,
2020
DOI:10.1016/j.tsf.2020.137891
|
|
|
|
|
[11]
|
Investigation on thickness and annealing effects on physical properties and electrical circuit model of CuO sprayed thin films
Superlattices and Microstructures,
2020
DOI:10.1016/j.spmi.2020.106508
|
|
|
|
|
[12]
|
Electrical impedance spectroscopy characterization of ZnTe thin film deposited by R-F sputtering
Physica B: Condensed Matter,
2019
DOI:10.1016/j.physb.2019.07.050
|
|
|
|
|
[13]
|
Structural, morphological and electrical characterization of ceria-based nanostructured thin films obtained by ultrasonic spray pyrolysis
Boletín de la Sociedad Española de Cerámica y Vidrio,
2018
DOI:10.1016/j.bsecv.2018.06.004
|
|
|
|
|
[14]
|
Complex impedance spectroscopy of Sn 4 Sb 6 S 13 thin films deposited by thermal vacuum evaporation
Thin Solid Films,
2017
DOI:10.1016/j.tsf.2017.04.028
|
|
|
|
|
[15]
|
Electrical characterization of SnSb4S7 thin films by impedance spectroscopy
Journal of Materials Science: Materials in Electronics,
2016
DOI:10.1007/s10854-016-4300-4
|
|
|
|