point electronic GmbH

SEM Modernization powered by point electronic: What is the 𝗱𝗶𝗳𝗳𝗲𝗿𝗲𝗻𝗰𝗲 𝘁𝗼 𝗮 𝗿𝗲𝗳𝘂𝗿𝗯𝗶𝘀𝗵𝗺𝗲𝗻𝘁 𝗼𝗿 𝘂𝗽𝗴𝗿𝗮𝗱𝗲? 💡In short: familiar shell, new core. Our SEM #Modernization equips existing microscopes with 🔬 high-performance electronics and software made by point electronic GmbH. This means that a #SEMmodernization goes ⤴️ far beyond a #refurbishment, #upgrade or #remanufacturing of an existing device. The electron microscope will receive 🌟modern, user-friendly and intuitive software, low-interference high-speed electronics, improved energy efficiency and new automation made by point electronic. 🚀 This secures the operation of an existing SEM for more than a decade. Our overview 📝 compares central aspects of a point electronic SEM Modernization, and typical refurbishments or upgrades. #electronmicroscopy #modernisation #sustainability #refurbish #reman #pointelectronic

✨ Season's Greetings from all of us at point electronic GmbH!   We wish our customers, partners and team members a peaceful and joyful season with time to relax and filled with joy. A heartfeld thanks for your trust, support and collaboration throughout 2024 and for being part of our journey! 💙   Here’s to a vibrant New Year filled with inspiration, innovation, and partnership! 🚀 #seasonsgreetings #happynewyear #partnership #pointelectronic

Imina Technologies SA Technologies is now the exclusive supplier of point electronic GmbH's Electrical Failure Analysis solutions for SEM and dual beam microscopes. “This great partnership began a decade ago and has reached an exciting new milestone,” says Guillaume Boetsch, co-founder and Head of Sales & Marketing at 𝗜𝗺𝗶𝗻𝗮 𝗧𝗲𝗰𝗵𝗻𝗼𝗹𝗼𝗴𝗶𝗲𝘀. "Developing such a cutting-edge product is only possible through respectful, unbiased and open collaboration. This spirit has existed with Imina from the very beginning and is built on mutual trust on both sides," says Christoph Sichting, Managing Director of 💠point electronic GmbH. Together, the companies have developed a true synergy. „By combining highly precise nanoprobing, streamlined user workflow, and state-of-the-art signal acquisition and processing, we offer what we believe is the best-in-class solution,” says Guillaume Boetsch. For more than 10 years, Imina Technologies SA and point electronic GmbH have been offering integrated solutions for nanoprobing and electrical failure analysis techniques such as #EBIC, #EBAC and #EBIRCh. The workflow is fully integrated, so users don't have to switch between different programs during measurements. The most advanced version offers 𝗹𝗶𝘃𝗲 𝗰𝗼𝗹𝗼𝗿-𝗰𝗼𝗱𝗲𝗱 𝗘𝗙𝗔 for more intuitive workflow, especially in complex samples like advanced technology nodes. Both companies will continue further advancing the product, drawing on their extensive experience in Electrical Failure Analysis. “We highly appreciate that point electronic is entrusting Imina Technologies with the exclusive management of joint EFA solution. We can now further enhance the experience for our users both in terms of usability, and access to service and technical support,” adds Guillaume Boetsch. #semiconductor #semiconductorindustry #nanoprobing #failureanalysis #pointelectronic #ElectricalFailureAnalysis

This could be your POV! 📍 Christoph Sichting and Mathias Mosig are on-site at our booth #513 at 𝗠𝗥𝗦 𝗙𝗮𝗹𝗹 𝟮𝟬𝟮𝟰, happy to show you how to 🔬 advance materials research in electron microscopy. So stop by here, and say hello if you're around! #FallMRS24 #f24mrs

🚀 𝗥𝗘𝗩𝗢𝗟𝗢𝗡 𝘀𝗰𝗮𝗻-𝗰𝗼𝗻𝘁𝗿𝗼𝗹 𝗦𝗗𝗞 𝗼𝗻 𝗚𝗶𝘁𝗛𝘂𝗯 🚀 This gives owners of REVOLON TEM controllers access to powerful tools to develop their own scanning apps, and to get the latest updates.   𝗪𝗵𝘆 𝗱𝗼 𝘄𝗲 𝗱𝗼 𝘁𝗵𝗶𝘀? 💠 We believe that 𝗳𝗿𝗲𝗲 𝗺𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 means access to interfaces documentation, control libraries and sample code. For us that means prioritising 𝘁𝗿𝗮𝗻𝘀𝗽𝗮𝗿𝗲𝗻𝗰𝘆 𝗳𝗼𝗿 𝘂𝘀𝗲𝗿𝘀 𝗮𝗻𝗱 𝗱𝗲𝘃𝗲𝗹𝗼𝗽𝗲𝗿𝘀. We intentionally design our Software Development Kits (SDK) with 𝗺𝗮𝗸𝗲𝗿𝘀 in mind. Offering our SDKs as repositories is therefore a natural step in our philosophy.   GitHub gives easy access to our SDK repository for point electronic GmbH 𝗥𝗘𝗩𝗢𝗟𝗢𝗡 TEM scan controllers, offering the information necessary for development of new independent applications, or for community driven projects. 𝗨𝗽𝗱𝗮𝘁𝗲𝘀 and future releases will be delivered here, with new features, bug fixes and new code examples. We are certain this will enable faster development and enhanced integration in the field.   The SDK repository is also available for 𝗗𝗜𝗦𝗦𝟲 SEM scan controllers by point electronic. 𝗪𝗵𝗮𝘁 𝗶𝘀 𝗚𝗶𝘁𝗛𝘂𝗯? 💠 GitHub is a developer platform for creating, managing, and sharing code, using Git for version control, bug tracking, task management, and more.   𝗪𝗵𝗮𝘁 𝗰𝗮𝗻 𝘆𝗼𝘂 𝗲𝘅𝗽𝗲𝗰𝘁 𝗳𝗿𝗼𝗺 𝘁𝗵𝗲 𝗦𝗗𝗞 𝗿𝗲𝗽𝗼𝘀𝗶𝘁𝗼𝗿𝘆? 💠 SDK includes detailed documentation on available calls and parameters, in HTML and PDF format, as well as the binary libraries for Windows, Linux and macOS. Sample code in Python ranges from basic image scans to advanced pixel maps:  🔹Basic image scan with one detector signal 🔹Basic image scan with simultaneous signals 🔹Basic Region Of Interest (ROI) scan 🔹Advanced pixel map for serpentine scans 🔹Advanced pixel map for spiral scans   𝗛𝗼𝘄 𝘁𝗼 𝗴𝗲𝘁 𝗮𝗰𝗰𝗲𝘀𝘀? 💠 Users who already own a REVOLON TEM Scan Controller by point electronic GmbH, or have purchased the optional SDK package for the DISS6 SEM scan controller, should contact us at 𝗲𝗻𝗴𝗶𝗻𝗲𝗲𝗿𝗶𝗻𝗴@𝗽𝗼𝗶𝗻𝘁𝗲𝗹𝗲𝗰𝘁𝗿𝗼𝗻𝗶𝗰.𝗱𝗲 with the 𝘂𝗻𝗶𝘁 𝗦𝗲𝗿𝗶𝗮𝗹 𝗡𝘂𝗺𝗯𝗲𝗿 to get free access. #REVOLON #DISS6 #TEM Grigore Moldovan

𝗛𝗼𝘄 𝘁𝗼 𝗮𝗱𝗱 𝘁𝗵𝗲 𝟯𝗿𝗱 𝗗𝗶𝗺𝗲𝗻𝘀𝗶𝗼𝗻 𝘁𝗼 𝘆𝗼𝘂𝗿 𝗳𝗿𝗮𝗰𝘁𝘂𝗿𝗲 𝗮𝗻𝗮𝗹𝘆𝘀𝗶𝘀 in SEM? See how here, and at our ➡️ booth #513 at 🤝 𝗠𝗥𝗦 𝗙𝗮𝗹𝗹 𝟮𝟬𝟮𝟰 in Boston next week.   🖼️ Adding 𝘁𝗼𝗽𝗼𝗴𝗿𝗮𝗽𝗵𝗶𝗰𝗮𝗹 𝗱𝗮𝘁𝗮 to SEM images enables the distinction of otherwise hard-to-identify fracture features, such as lamellar structures, vibration strips, or unspecific features in less ductile materials.   🔬 The point electronic GmbH 𝗕𝗦𝗘 𝗧𝗼𝗽𝗼𝗴𝗿𝗮𝗽𝗵𝘆 𝘀𝘆𝘀𝘁𝗲𝗺 performs live, calibrated height measurements during image acquisition, providing real-time 3D feedback that enhances fracture mechanism classification. 💠   ⛰️ With 𝗰𝗼𝗺𝗽𝘂𝘁𝗲𝗿-𝗮𝘀𝘀𝗶𝘀𝘁𝗲𝗱 𝗳𝗿𝗮𝗰𝘁𝗼𝗴𝗿𝗮𝗽𝗵𝘆, height information greatly improves the reliability and accuracy of classification. A typical BSE-Topography workflow involves a single scan that records SE and BSE signals along with a surface height map. Pairing this with automated data acquisition, the point electronic BSE Topography system efficiently generates images and precise height data, supporting machine learning applications.   🖥️ Learn more about our BSE Topography system: https://lnkd.in/efxmmS-A   Software assisted fractography - speed and better results: 💠 ability to acquire a big amount of data 💠 display 3D topography data in live mode 💠 live calculation of 3D information 💠 live sample navigation in 3D 💠 support for in-situ applications 💠 all data is acquired in a single scan

New week, new conference for our colleague 𝗠𝗮𝘁𝗵𝗶𝗮𝘀 𝗠𝗼𝘀𝗶𝗴. 🌏 This week he is for point electronic GmbH in Korea 🇰🇷, where our partner 𝗞𝗼𝗿𝗲𝗮 𝗜𝗧𝗦 has a booth at the 𝗙𝗮𝗹𝗹 𝗠𝗲𝗲𝘁𝗶𝗻𝗴 𝟮𝟬𝟮𝟰 of the Korean Society of Microscopy.

🏆Our warmest congratulations to Dr. Trushal Sardhara on winning the 𝗕𝗲𝘁𝗵𝗴𝗲 𝗣𝗿𝗶𝘇𝗲 𝗳𝗼𝗿 𝗔𝗽𝗽𝗹𝗶𝗲𝗱 𝗠𝗮𝘁𝗲𝗿𝗶𝗮𝗹𝘀 𝗦𝗰𝗶𝗲𝗻𝗰𝗲 𝟮𝟬𝟮𝟰! 🎉🤝 ↗️ To support young scientists, point electronic GmbH has sponsored the 𝗛𝗲𝗶𝗻𝘇 𝗕𝗲𝘁𝗵𝗴𝗲 𝗣𝗿𝗶𝘇𝗲 𝗳𝗼𝗿 𝗠𝗮𝘁𝗲𝗿𝗶𝗮𝗹𝘀 𝗦𝗰𝗶𝗲𝗻𝗰𝗲 𝟮𝟬𝟮𝟰 of the Heinz-Bethge-Stiftung. 💠 According to the jury, his doctoral thesis “𝟯𝗗 𝗥𝗲𝗰𝗼𝗻𝘀𝘁𝗿𝘂𝗰𝘁𝗶𝗼𝗻 𝗼𝗳 𝗙𝗜𝗕 𝗧𝗼𝗺𝗼𝗴𝗿𝗮𝗽𝗵𝘆 𝗗𝗮𝘁𝗮 𝗨𝘀𝗶𝗻𝗴 𝗠𝗮𝗰𝗵𝗶𝗻𝗲 𝗟𝗲𝗮𝗿𝗻𝗶𝗻𝗴” represents a significant advancement in the 3D reconstruction of nanomaterials, setting new standards in precision and efficiency within materials science.   🧑🔬 “𝗪𝗲 𝘄𝗮𝗻𝘁 𝘁𝗼 𝗲𝗻𝗰𝗼𝘂𝗿𝗮𝗴𝗲 𝘆𝗼𝘂𝗻𝗴 𝘀𝗰𝗶𝗲𝗻𝘁𝗶𝘀𝘁𝘀 𝘁𝗼 𝘀𝗵𝗮𝗽𝗲 𝘁𝗵𝗲 𝗲𝗹𝗲𝗰𝘁𝗿𝗼𝗻 𝗺𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 𝗼𝗳 𝘁𝗼𝗺𝗼𝗿𝗿𝗼𝘄,” says Christoph Sichting, Managing Director of point electronic GmbH about the motivation. “Young talents are a driving force behind innovations in materials research. Their work not only contributes to pushing the boundaries of knowledge, but also to opening up new technologies and applications for electron microscopy.”   💙 point electronic has been committed to promoting young talent in this field for many years. The company is not only a 𝗹𝗼𝗻𝗴-𝘀𝘁𝗮𝗻𝗱𝗶𝗻𝗴 𝗺𝗲𝗺𝗯𝗲𝗿 𝗼𝗳 𝘁𝗵𝗲 𝗕𝗼𝗮𝗿𝗱 𝗼𝗳 𝗧𝗿𝘂𝘀𝘁𝗲𝗲𝘀 𝗼𝗳 𝘁𝗵𝗲 𝗛𝗲𝗶𝗻𝘇 𝗕𝗲𝘁𝗵𝗴𝗲 𝗙𝗼𝘂𝗻𝗱𝗮𝘁𝗶𝗼𝗻, but also supports its 𝘀𝗰𝗵𝗼𝗼𝗹 𝗹𝗮𝗯𝗼𝗿𝗮𝘁𝗼𝗿𝘆 in order to inspire enthusiasm for materials science and electron microscopy at an early age. 🖊️ For students, point electronic offers supervision and support for their Master's theses. ➡️ To read more:  https://lnkd.in/ejip_QMf (photo from left to right: Dr. Franz-Josef Schmitt (Deputy Chairman and Head of the Electron Microscopy Student Laboratory), Prof. Dr. Ralf Wehrspohn (Chairman), Dr. Trushal Sardhara (University Hospital of RWTH Aachen), Christoph Sichting (Managing Director of point electronic GmbH), Prof. Dr. Goerg H. Michler (Chairman))

🛣️ point electronic on the road again! Along with Damien Jeanmaire from our UK partner EM Systems Support, our colleague Mathias Mosig is currently attending the 𝗙𝗿𝗼𝗻𝘁𝗶𝗲𝗿𝘀 𝗶𝗻 𝗣𝗵𝘆𝘀𝗶𝗰𝗮𝗹 𝗜𝗺𝗮𝗴𝗶𝗻𝗴 𝟮𝟬𝟮𝟰 conference in London. 🔬 We are enjoying engaging discussions on the latest advances and innovations in electron microscopy for material analysis and in-situ techniques.

🍂 We are already hugely looking forward to 𝟮𝟬𝟮𝟰 𝗠𝗥𝗦 𝗙𝗮𝗹𝗹 𝗠𝗲𝗲𝘁𝗶𝗻𝗴 & 𝗘𝘅𝗵𝗶𝗯𝗶𝘁 in Boston, the annual event hosted by the Materials Research Society! ⭐ It is the last big event for us this year, and we are looking forward to rounding an amazing conference 2024 there. So take your chance, drop by our booth #513, and have a chat with us. Here's what you'll find at our booth: 💠𝗥𝗘𝗩𝗢𝗟𝗢𝗡 Our advanced TEM scan controller, featuring a high-performance scan generator and image acquisition with open access, allowing unrestricted beam control and Python sample codes for customized coding. 💠𝗦𝗘𝗠 𝗠𝗼𝗱𝗲𝗿𝗻𝗶𝘇𝗮𝘁𝗶𝗼𝗻 More than an upgrade or simple refurbishment— our modernization is a complete revitalization of your SEM, equipped with state-of-the-art electronics, software, and controls, designed by point electronic GmbH. 💠𝗦𝗧𝗘𝗠 𝗘𝗹𝗲𝗰𝘁𝗿𝗼𝗻 𝗖𝗼𝘂𝗻𝘁𝗶𝗻𝗴 Including a turboTEM PULSE single electron processor and a point electronic GmbH #REVOLON, the system enables to produce images with calibrated units of individual electrons, ensuring a true zero background level and minimal noise, thereby enhancing the precision and reliability of measurements. 💠𝗧𝗘𝗠 𝗘𝗹𝗲𝗰𝘁𝗿𝗶𝗰𝗮𝗹 𝗔𝗻𝗮𝗹𝘆𝘀𝗶𝘀 This system enables direct correlation of in-situ imaging of electrical activity with high-resolution data. 💠𝗦𝗘𝗠 𝗘𝗹𝗲𝗰𝘁𝗿𝗶𝗰𝗮𝗹 𝗔𝗻𝗮𝗹𝘆𝘀𝗶𝘀 This quantitative EA system offers top-level integration and automation. Together with our U.S. distributor Angstrom Scientific (booth #317), we’ll present additional solutions to enhance your microscopy experience. ➡️ Find all event details here: https://lnkd.in/esy8xu4Z