[en] This paper describes metrology of a vertically focusing mirror on the bending magnet beamline in sector-1 of the Advanced Photon Source, Argonne National Laboratory. The mirror was evaluated using measurements from both an optical long trace profiler and x-rays. Slope error profiles obtained with the two methods were compared and were found to be in a good agreement. Further comparisons were made between x-ray measurements and results from the SHADOW ray-tracing code

[en] An International Workshop on Metrology for X-ray and Neutron Optics has been held March 16-17, 2000, at the Advanced Photon Source, Argonne National Laboratory, near Chicago, Illinois (USA). The workshop gathered engineers and scientists from both the U.S. and around the world to evaluate metrology instrumentation and methods used to characterize surface figure and finish for long grazing incidence optics used in beamlines at synchrotrons radiation sources. This two-day workshop was motivated by the rapid evolution in the performance of x-ray and neutron sources along with requirements in optics figure and finish. More specifically, the performance of future light sources, such as free-electron laser (FEL)-based x-ray sources, is being pushed to new limits in term of both brilliance and coherence. As a consequence, tolerances on surface figure and finish of the next generation of optics are expected to become tighter. The timing of the workshop provided an excellent opportunity to study the problem, evaluate the state of the art in metrology instrumentation, and stimulate innovation on future metrology instruments and techniques to be used to characterize these optics. This paper focuses on FEL optics and metrology needs. (A more comprehensive summary of the workshop can be found elsewhere.) The performance and limitations of current metrology instrumentation will be discussed and recommendations from the workshop on future metrology development to meet the FEL challenges will be detailed

[en] A simple device composed of a modular double-pentaprism system that enables the long trace profiler (LTP) to measure mirrors in nonconventional ways, i.e., in the vertical-downward and sideways positions, has been devised and implemented in the Advanced Photon Source (APS) long trace profiler (LTP II). The systems is very useful in calibrating mirror-bender assemblies. This paper describes the system and gives results of measurements performed with it on a mirror used at the APS

[en] Results of an experimental study of the contact heat conductance across a single diamond crystal interface with OFHC copper (Cu) are reported. Gallium-indium (GaIn) eutectic was used as an interstitial material. Contact conductance data are important in the design and the prediction of the performance of x-ray diamond monochromators under high-heat-load conditions. Two sets of experiments were carried out. In one, the copper surface in contact with diamond was polished and then electroless plated with 1 μm of nickel, while in the other, the copper contact surface was left as machined. Measured average interface heat conductances are 44.7 ±8 W/cm²-K for nonplated copper and 23.0 ±3 W/cm²-K for nickel-plated copper. For reference, the thermal contact conductances at a copper-copper interface (without diamond) were also measured, and the results are reported. A typical diamond monochromator, 0.2 mm thick, will absorb about 44 W under a standard undulator beam at the Advanced Photon Source. The measured conductance for nickel-plated copper suggests that the temperature drop across the interface of diamond and nickel-plated copper, with a 20 mm² contact area, will be about 10 degree C. Therefore temperature rises are rather modest, and the accuracy of the measured contact conductances presented here are sufficient for design purposes

[en] Cryogenically cooled, single-crystal silicon, x-ray monochromators offer much better thermal performance than room-temperature silicon monochromators. The improved performance can be quantified by a figure-of-merit equal to the ratio of the thermal conductivity to the coefficient of thermal expansion. This ratio increases by about a factor of 50 as the temperature is decreased from 300 K to 100 K. An extensive thermal and structural finite element analysis is presented for an inclined, liquidnitrogen-cooled, Si monochromator crystal diffracting 4.2 keV photons from the [111] planes using Undulator A at the Advanced Photon Source. The angular size of the beam accepted on the crystal was chosen to be 50 μrad vertically and 120 μrad horizontally. The deflection parameter, K, was 2.17 for all cases. The peak power density at normal incidence to the beam was calculated to be 139 W/mm², and the total power was 750 W at a distance of 30 m from the source for a positron current of 100 mA. The crystal was oriented in the inclined geometry with an inclination angle of 85 degree for all cases. The performance of the crystal was investigated for beam currents of 100, 200, and 300 mA. The calculated peak slopes of the diffraction plane over the extent of the beam footprint were -1.17, -2.35, and 0.33 μrad, and the peak temperatures were 88.2, 102.6, and 121.4 K, respectively. The variation in the Bragg angle due to change in d-spacing across the beam footprint was less than 1 μrad for all cases. These results indicate that a properly designed, cryogenically cooled, inclined silicon monochromator can deliver the full brilliance of Undulator A at even the highest machine currents

[en] The Advanced Photon Source (APS) x-ray optics Metrology Laboratory currently operates a small-aperture Wyko laser interferometer in a stitching configuration. While the stitching configuration allows for easier surface characterization of long x-ray substrates and mirrors, the addition of mechanical components for optic element translation can compromise the ultimate measurement performance of the interferometer. A program of experimental vibration measurements, quantifying the laboratory vibration environment and identifying interferometer support-system behavior, has been conducted. Insight gained from the ambient vibration assessment and modal analysis has guided the development of a remediation technique. Discussion of the problem diagnosis and possible solutions are presented in this paper

[en] This report discusses: APS bending magnet source; beamline layout; beamline optical components; beamline operation; time-resolved studies station; polarization studies station; and commissioning and operational schedule

[en] This paper describes the experimental and analytical program in cryogenic cooling of high-heat-load optics at the Advanced-Photon Source. A prototype liquid nitrogen pumping system has been procured. This pump provides a variable flow rate of 1 to 10 gpm of pressurized liquid nitrogen and is sized to handle up to 5 kW of optic heat load. Also, a high-vacuum, double-crystal monochromator testing tank has been fabricated. This system will be used to test cryogenic crystals at existing synchrotron sources. A finite element analysis has been performed for a cryogenically cooled Si crystal in the inclined geometry for Undulator A at 100 mA. The inclination angle was 80 degrees. It was set to diffract from the (111) planes at the first harmonic energy of 4.2 keV. The maximum slope error in the diffraction plane was calculated to be about 1 μrad with a peak temperature of 94 K. An analysis has also been performed for a cryogenically-cooled ''thin'' crystal oriented in the Bragg geometry which accepts 87% of the lst harmonic photons at 3.866 keV. The total absorbed power was 131 W at 100 mA current and the peak temperature was 124 K

[en] Long trace profilers (LTPS) have been used at many synchrotron radiation laboratories worldwide for over a decade to measure surface slope profiles of long grazing incidence x-ray mirrors. Phase measuring interferometers (PMIs) of the Fizeau type, on the other hand, are being used by most mirror manufacturers to accomplish the same task. However, large mirrors whose dimensions exceed the aperture of the Fizeau interferometer require measurements to be carried out at grazing incidence, and aspheric optics require the use of a null lens. While an LTP provides a direct measurement of ID slope profiles, PMIs measure area height profiles from which the slope can be obtained by a differentiation algorithm. Measurements of the two types of instruments have been found by us to be in good agreement, but to our knowledge there is no published work directly comparing the two instruments. This paper documents that comparison. We measured two different nominally flat mirrors with both the LTP in operation at the Advanced Photon Source (a type-II LTP) and a Fizeau-type PMI interferometer (Wyko model 6000). One mirror was 500 mm long and made of Zerodur, and the other mirror was 350 mm long and made of silicon. Slope error results with these instruments agree within nearly 100% (3.11 ± 0.15 (micro)rad for the LTP, and 3.11 ± 0.02 (micro)rad for the Fizeau PMI interferometer) for the medium quality Zerodur mirror with 3 (micro)rad rms nominal slope error. A significant difference was observed with the much higher quality silicon mirror. For the Si mirror, slope error data is 0.39 ± 0.08 (micro)rad from LTP measurements but it is 0.35 ± 0.01 (micro)rad from PMI interferometer measurements. The standard deviations show that the Fizeau PMI interferometer has much better measurement repeatability.

[en] Stitching interferometry, using small-aperture, high-resolution, phase-measuring interferometry, has been proposed for quite some time now as a metrology technique to obtain 3-dimensional profiles of surfaces of oversized optical components and substrates. The aim of this work is to apply this method to the specific case of long grazing-incidence x-ray mirrors, such as those used in beamlines at synchrotron radiation facilities around the world. Both fabrication and characterization of these mirrors would greatly benefit from this technique because it offers the potential for providing measurements with accuracy and resolution better than those obtained using existing noncontact laser profilers, such as the long trace profiler (LTP). Measurement data can be used as feedback for computer-controlled fabrication processes to correct for possible topography errors. The data can also be used for simulating and predicting mirror performance under realistic conditions. A semiautomated stitching system was built and tested at the X-ray Optics Metrology Laboratory of the Advanced Photon Source at Argonne National Laboratory. The initial objective was to achieve a measurement sensitivity on the order of 1 (micro)rad rms. Preliminary tests on a 1 m-long x-ray mirror showed system repeatability of less than 0.6 (micro)rad rms. This value is comparable to that of a conventional LTP. The measurement accuracy was mostly affected by environmental perturbations and system calibration effects. With a fully automated and improved system (to be built in the near future), we expect to achieve measurement sensitivity on the order of 0.0 (micro)rad rms or better. In this paper, after a brief review of basic principles and general technical difficulties and challenges of the stitching technique, a detailed description of the measurement setup is given and preliminary results obtained with it are analyzed and discussed