[en] Energy dependence of the optical constants of boron carbide in the short period Ru/B4C and Mo/B4C multilayers (MLs) are evaluated from complete reflectivity scans across the boron K edge using the energy-resolved photon-in-photon-out method. Differences between the refractive indices of the B4Cmaterial inside and close to the surface are obtained from the peak profile of the first order ML Bragg peak and the reflection profile near the critical angle of total external reflection close to the surface. Where a Mo/B4C ML with narrow barrier layers appears as a homogeneous ML at all energies, a Ru/B4C ML exhibits another chemical nature of boron at the surface compared to the bulk. From evaluation of the critical angle of total external reflection in the energy range between 184 and 186 eV, we found an enriched concentration of metallic boron inside the Ru-rich layer at the surface, which is not visible in other energy ranges.

[en] Semiconductor based 1D nanostructures are of high technological interest due to potential application in 1D conductivity measurements and optical devices. Catalyst assisted solution-liquid-solid synthesis is a new method where nanocrystal catalysts are used to grow CdSe nanorods (NR) from solution. The aim of this study is to investigate CdSe samples prepared with this new method by means of X-ray diffraction. The measurements have been performed at DELTA synchrotron using a beam of wavelength 1.127A and an image plate system. It is found that the CdSe NRs have a crystal structure of wurtzite with an aspect ratio changing between 2 and 10. This is in contradiction with the results obtained from TEM measurements, according to which the lengths of the NRs are in the order of 1 μ and the widths are around 20 nm. Presently the results are interpreted by the appearance of stacking faults which separate uniformly stacked AB, AB layers from each other. It is planned to measure an individual NR using a nanofocused X-ray beam. Once an individual NR could be observed, the next step is to measure the powder spectrum using a CCD as a function of the position of the beam spot along the nanorod. Depending on this information, the parameters affecting the structure of the NRs would be clear by making experiments with samples prepared in different conditions

[en] Non-coplanar x-ray grazing incidence diffraction is an appropriate method to investigate the strain and compositional set-up of semiconductor nanostructures. Exploiting refraction effects at the air-sample interfaces, the penetration depth of the probing x-ray can by tailored between a few and several hundred nanometers below the surface. While the detected signal is Bragg-diffracted at a lattice plane directed perpendicular to the surface, the method possesses the capability for a depth-resolved analysis of the relaxation state in semiconductor multilayers. Beside vertically stacked structures, it can be applied for the investigation of laterally patterned nanostructures, such as free-standing and buried surface gratings. This article will introduce the reader to the experimental set-up, the resolution condition, and theoretical approaches necessary for running and interpreting GID-experiments, followed by a brief review of recent applications. (author)

[en] Using coherent white synchrotron radiation in the hard X-ray region for reflectivity experiments one have access to sample properties on a nanometer scale in principle. To extract the wanted information from the performed measurements so called phase retrieval algorithms are necessary. The authors developed a straight forward simulation program based on a spatial limited atomic flat surface to evaluate the influence of different parameters on the coherent scattered signal in the detector plane. These simulations can explain some interesting features of the measurements and shows unexpected results for the influence of the so called illumination function

No abstract available

[en] Soft-x-ray Bragg reflection from two Ru/B4C multilayers with 10 and 63 periods was used for independent determination of both real and imaginary parts of the refractive index n = 1 -δ + iβ close to the boron K edge (∼188 eV). Prior to soft x-ray measurements, the structural parameters of the multilayers were determined by x-ray reflectometry using hard x rays. For the 63-period sample, the optical properties based on the predictions made for elemental boron major deviations were found close to the K edge of boron for the 10-period sample explained by chemical bonding of boron to B4C and various boron oxides.

[en] Multilayer mirrors made for the use in the wavelength range near K-edge of boron (188 eV) are of great interest for X-ray fluorescence analysis of boron content in doped semiconductors, plasma diagnostics, astronomy and lithography. Moreover, multilayer mirrors composed by a metal and a low Z element like boron are used as optical elements in both the soft x-ray spectral range as well as at higher photon energies on 3rd generation synchrotron beamlines. Using an energy-resolved photon-in-photon-out method we reconstructed the optical data from energy dependence of both integrated peak intensity and FWHM of the 1st order ML Bragg peak measured at the UHV triple axis soft-x-ray reflectometer at BESSY II. The experiments clearly demonstrate that the peak shape of the ML Bragg peak is most sensitive to any kind of electronic excitation and recombination in solid. The soft-ray reflectivity can give detailed information for MLs with thickness up to several tens of nanometers. In addition, measurements close to a resonance edge probe the chemical state of the respective constituent accompanied with a high sensitivity of changes close to the sample surface.

[en] The kinetics of growth and erasure of light-induced surface relief gratings (SRG) inscribed onto polymer films containing photosensitive moieties can be investigated by means of visible gratings (SRG) light (VIS) and/or x-ray scattering provided by a low power laser and by a synchrotron radiation source, respectively. Both methods are complementary due to their different depth sensitivity. The SRG's appear with nearly perfect sinusoidal shape and amplitudes of up to few 100 nm and are accompanied by a density grating (DG) below the surface. Both lattices have equal lateral spacing and give rise to subsidiary scattering peaks in addition to the specular one. The intensity of these peaks can be measured as a function of time to examine different theories of polymer kinetics at light exposure. This paper provides an analytical approach of Born scattering theory which is capable to describe both scattering experiments on quantitative and comparable level. It considers the different mechanisms of VIS and x-ray scattering and provides formulas which allow one to distinguish the contributions of SRG and DG to the scattering signal. The capability of approach is verified by simulation of experimental scattering curves

[en] Static speckle experiments were performed using coherent white X-ray radiation from a bending magnet at BESSYII. Semiconductor and polymer surfaces were investigated under incidence condition smaller than the critical angle of total external reflection. The scattering pattern of the sample results from the illumination function modified by the surface undulations. The periodic oscillations are caused by the illumination function whereas other irregular features are associated with sample surface. The speckle map of reflection from a laterally periodic structure like GaAs grating is studied. Under coherent illumination the grating peaks split into speckles because of fluctuations on the sample surface. It is important to understand which length scales on the sample surface are responsible for the oscillations in reflectivity map. To investigate this experiments are done with a triangular shaped sample. Different parts of the sample are illuminated with the footprint on the sample larger or smaller than the actual sample length. This gives prior information about total illuminated area on the sample. Using this additional information a detailed surface profile of the sample is reconstructed

No abstract available