AbstractAbstract
[en] The preparation of 3d-transition metal-doped EuO thin films by molecular beam epitaxy is investigated using the example of Sc doping. The Sc-doped EuO samples display a good crystalline structure, despite the relatively small ionic radius of the dopant. The Sc doping leads to an enhancement of the Curie temperature to up to 125 K, remarkably similar to previous observations on lanthanide-doped EuO
Source
(c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Record Type
Journal Article
Journal
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
External URLExternal URL
AbstractAbstract
[en] Growth and magnetic characterization of thin films of Co2Cr0.6Fe0.4Al and Co2MnSi full-Heusler compounds are investigated. Thin films were deposited by magnetron sputtering at room temperature directly onto oxidized Si wafers. These Heusler films are magnetically very soft and ferromagnetic with Curie temperatures well above room temperature. Polycrystalline Co2Cr0.6Fe0.4Al Heusler films combined with MgO barriers and CoFe counter electrodes are structured to magnetic tunnel junctions and yield almost 50% magnetoresistance at room temperature. The magnetoresistance shows a strong bias dependence with the maximum occurring at a voltage drop well above 1 V. This special feature is accompanied by only a moderate temperature dependence of the tunnel magnetoresistance
Primary Subject
Source
10. joint MMM/INTERMAG conference; Baltimore, MD (United States); 7-11 Jan 2007; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Record Type
Journal Article
Literature Type
Conference
Journal
Country of publication
CHROMIUM ALLOYS, COBALT ALLOYS, CRYSTAL GROWTH, CURIE POINT, DEPOSITION, ELECTRODES, HEUSLER ALLOYS, IRON ALLOYS, MAGNESIUM OXIDES, MAGNETORESISTANCE, POLYCRYSTALS, SILICON ALLOYS, SPUTTERING, SUPERCONDUCTING JUNCTIONS, TEMPERATURE DEPENDENCE, TEMPERATURE RANGE 0273-0400 K, THIN FILMS, TUNNEL EFFECT, VOLTAGE DROP
ALKALINE EARTH METAL COMPOUNDS, ALLOYS, ALUMINIUM ALLOYS, CHALCOGENIDES, COPPER ALLOYS, COPPER BASE ALLOYS, CORROSION RESISTANT ALLOYS, CRYSTALS, ELECTRIC CONDUCTIVITY, ELECTRICAL PROPERTIES, FILMS, MAGNESIUM COMPOUNDS, MANGANESE ALLOYS, OXIDES, OXYGEN COMPOUNDS, PHYSICAL PROPERTIES, TEMPERATURE RANGE, THERMODYNAMIC PROPERTIES, TRANSITION ELEMENT ALLOYS, TRANSITION TEMPERATURE
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
External URLExternal URL
AbstractAbstract
[en] We report on our study on the influence of the growth conditions on the europium/oxygen stoichiometry, morphology, magnetic properties, and electrical conductivity of EuO thin films. SQUID magnetometry and x-ray photoelectron spectroscopy were utilized as complementary techniques to determine the oxygen content of EuO1±x thin films grown by molecular beam epitaxy with and without the employment of the so-called Eu distillation process. We found indications for phase separation to occur in Eu-rich as well as in over-oxidized EuO for films grown at substrate temperatures below the Eu distillation temperature. Only a fraction of the excess Eu contributes to the metal-insulator transition in Eu-rich films grown under these conditions. We also observed that the surfaces of these films were ill defined and may even contain more Eu excess than the film average. Only EuO films grown under distillation conditions are guaranteed to have the same magnetic and electrical properties as stoichiometric bulk EuO, and to have surfaces with the proper Eu/O stoichiometry and electronic structure.
Primary Subject
Source
(c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Record Type
Journal Article
Journal
Physical Review. B, Condensed Matter and Materials Physics; ISSN 1098-0121; ; v. 84(15); p. 155442-155442.9
Country of publication
CHALCOGENIDES, CRYSTAL GROWTH METHODS, ELECTRICAL PROPERTIES, ELECTRON SPECTROSCOPY, ELECTRONIC EQUIPMENT, ELEMENTS, EPITAXY, EQUIPMENT, EUROPIUM COMPOUNDS, FILMS, FLUXMETERS, MEASURING INSTRUMENTS, METALS, MICROWAVE EQUIPMENT, NONMETALS, OXIDES, OXYGEN COMPOUNDS, PHOTOELECTRON SPECTROSCOPY, PHYSICAL PROPERTIES, RARE EARTH COMPOUNDS, RARE EARTHS, SEPARATION PROCESSES, SPECTROSCOPY, SUPERCONDUCTING DEVICES
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
External URLExternal URL