[en] The ³He breakup reaction has been studied with 119.2 MeV alpha particles at αp and αd quasifree scattering (QFS) conditions. In the coincidence energy spectra, large bumps corresponding to the QFS were observed. A calculation in plane-wave impulse approximation (PWIA) qualitatively reproduces the energy spectra. The ratio of the experimental peak cross sections to the calculated peak cross sections in the PWIA for the αp QFS is 0.1 and the ratio for the αd QFS which has angular dependence ranges about from 0.15 to 0.3. A calculation taking account of multiple scattering effect reduces the theoretical absolute cross sections considerably and reproduces the angular dependence of the ratio for the αd QFS. The ratio given by this calculation for the αp QFS is 0.4 and the one for the αd QFS is 0.86. (orig.)

[en] It is recognized that high electronic excitations play an important role in the damage process of solid targets by high-energy heavy ions. However, the conversion mechanism of the energy of the excited electrons into kinetic energy for target atom displacement is not well understood. In order to investigate the electronic excitation effects of high energy heavy ions in solids, we have studied the secondary ions mass spectra from thin conductive solid targets irradiated by swift heavy ion beams from the JAERI tandem accelerator in the energy region where the electronic stopping power is dominant. The results show the importance of the electronic excitation effect even in simple metallic (Cu) target. It is suggested that Coulomb explosion is the major mechanism of producing columnar defects along the incident ion path

[en] Sputtering processes of silicon in the bombardment of highly charged ions (HCIs) are studied using molecular dynamics simulation. Assuming the potential energy of the HCI transferred to target is stored as the electrostatic energy of Si atoms ionized by the HCI, the Si ions up to 375 are embedded on a Si(1 0 0) surface as an initial condition, resulting in Coulomb explosion. The dynamics of particle ejection (sputtering) from the surface and crater formation on the surface are simulated. The formation and propagation of shock wave and rapid increase of the sputtering yield are seen during relaxation process. Strong dependence of the sputtering yield on the HCIs potential energy is found and discussed in comparison with experiment

[en] In order to investigate the secondary ion emission from the surface of conductive materials bombarded by highly charged heavy ions, we have done two types of experiments. First, we have measured the yield of the sputtered ions from the surface of solid targets of conductive materials (Al, Si, Ni, Cu) bombarded by Xe^q+ (q=15-44) at 300 keV (v_p=0.30 a.u) and at 1.0 MeV (v_p=0.54 a.u). In view of the secondary ion yields as a function of the potential energy of the projectile, the increase rates below q=35, where the potential energy amounts to 25.5 keV, were rather moderate and showed a prominent increase above q=35. These phenomena were rather strong in the case of the metal targets. Second, we have measured the energy dependence of the yield of the sputtered ions from the surface of solid targets of conductive materials (C, Al) bombarded by Xe^q+ (q=30,36,44) between 76 keV (v_p=0.15 a.u) and 6.0 MeV (v_p=1.3 a.u). A broad enhancement of the secondary ion yield has been found for Al target bombarded by Xe⁴⁴⁺. From these experimental results, the electronic excitation effects in conductive materials for impact of slow highly charged heavy ions bearing high potential energy is discussed

[en] For the ³He(p,pp)²H and ³He(p,pd)¹H reactions at 64.9 MeV, analyzing powers measured in the quasifree scattering (QFS) region are similar to those for the elastic scatterings. The ratio of the cross sections measured in the QFS region to those calculated in the PWIA is reproduced by a calculation taking account of the double scattering effect. (author)

[en] The ³He(d,dd)¹H reaction was investigated with a vector polarized deuteron beam at 59.5 MeV in the quasifree scattering (QFS) conditions. The analyzing powers were obtained at nine coincidence angle pairs. They are compared with the analyzing powers for the dd elastic scattering with deuteron beam energy of 56 MeV. The maximum value of A_y is reduced considerably compared with that for the dd elastic scattering. A calculation of the A_y for the QFS bumps taking account of multiple scattering effect is in progress. (author)

[en] High-resolution Cu L X-ray spectra from Cu, Cu₂O and CuO targets induced by MeV H, He, C and F ions have been measured. High-resolution Cu Lα_1,2 and Lβ₁ X-ray spectra from Cu, Cu₂O and CuO targets induced by 2.0 MeV focused protons have been also measured. It is shown that high-resolution X-ray spectra are sensitive to the chemical states of the emitting projectile and target atoms. The Cu Lα_1,2 and Lβ₁ X-ray spectra were compared with Cu 2p XPS spectra to investigate the atomic and electronic structures and electron excitation and relaxation processes in Cu and its compounds. High-resolution X-ray spectroscopy with a microbeam is found to be useful for analysis of the chemical environment of atoms of interest in the near surface region of bulk and particle samples

[en] The characteristics of stored ions in a Kingdon trap have been investigated. The charge distributions of the stored ions was measured by a time of flight (TOF) mass spectrometer. Storage of Ar^q+ (q 1, 2, 3, 4) produced by electron beam irradiation has been confirmed. The dependence of Ar ion yields on the trapping potential and storage time have been symmetrically studied. Applying a voltage to the end plates is very important for the storage of ions. Remarkable oscillations of the ion yields are found in the decay curves as a function of storage time for Ar⁺, Ar²⁺ and Ar³⁺ indicating periodical motion of each ion group about the central wire. The three dimensional orbits of ions in the trap are analysed by a computer calculation in order to understand the experimental results. (Author)

[en] The possibility of chemical state analysis with a wavelength-dispersive X-ray spectrometer system for particle-induced X-ray emission (WDX-PIXE) using a light ion microbeam is described. High-resolution Cu Lα_1,2 and Lβ₁ X-ray spectra from Cu, Cu₂O and CuO targets are measured using this spectrometer system. The incident microbeam is focused 2.0 MeV protons with a beam size of 100(H)x30(V) μm². The Cu L X-ray spectra show two clear main peaks and their satellites. The main peaks are the Lα_1,2 and the Lβ₁ diagram lines, respectively. Due to a high detection efficiency of our spectrometer equipped with a position-sensitive detector for soft X-rays, the intensity ratio Lβ₁/Lα_1,2 is observable, which is the lowest for pure Cu metal, and the largest for CuO. Moreover, the Lα_1,2 X-ray spectrum for CuO shows a large shoulder at the high energy side of the main peak, which is considered to be due to the chemical bonding between Cu and O atoms. The results show that this system can be used for chemical state analysis for various compound materials and for analyzing small areas of materials or small particles

[en] Performance of a micro WDX-PIXE system that consists of position sensitive x-ray spectrometer and the heavy ion microbeam line is described. The influence of the position resolution of the position sensitive proportional counter (PSPC) used in the spectrometer on system energy resolution is discussed based on the measured values for C and O K x-rays. The system has successfully been used for chemical state analysis of various compound materials and small area of the materials (<3 x 10^-3 mm²) can be analyzed. (author)