AbstractAbstract
[en] An X-ray method for the determination of concentration profiles in thin film diffusion couples is presented. This method is based on the theory of Fourier analysis of X-ray diffraction profiles which is generalized to polycrystalline samples showing non-uniform lattice parameter. A Fourier synthesis of the concentration spectrum is possible when the influences of the particle size and the strain in the sample as well as the instrumental function are eliminated from the measured diffraction profile. This can be done by means of reference profiles obtained from layers of the diffusion components. Absorption of the radiation in the sample is negligible when diffusion couples of symmetrical sandwich structure are used. The method is tested experimentally in the system Au-Cu. (orig.)
[de]
Es wird eine Roentgenmethode zur Bestimmung von Konzentrationsprofilen in duennen Diffusionsdoppelschichten beschrieben. Ausgangspunkt dieser Methode ist die Theorie der Fourier-Analyse von Roentgenbeugungsprofilen, die fuer polykristalline Proben mit heterogenen Gitterparametern erweitert wurden. Eine Fourier-Analyse des Konzentrationsspektrums ist moeglich, wenn der Einfluss von Teilchengroesse und Spannung in der Probe und die Instrumentalfunktion aus dem gemessenen Beugungsprofil ausgeschlossen werden, was mit Hilfe von Diffusionsprofilen von Schichten der Diffusionskomponenten moeglich ist. Die Strahlenabsorption in der Probe ist vernachlaessigbar, wenn Diffusions-Doppelschichten mit symmetrischer Schichtung verwendet werden. Die Methode wird experimentell am System Au-Cu ueberprueft. (orig./AK)Source
1 fig.; 22 refs.
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Journal Article
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Applied Physics; v. 7(3); p. 175-179
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AbstractAbstract
No abstract available
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5. International thin films congress; Herzlia-on-Sea, Israel; 21 - 25 Sep 1981; Published in summary form only.
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Journal Article
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Conference
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Thin Solid Films; ISSN 0040-6090; ; v. 90(2); p. 174
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Reda, I.M.; Wagendristel, A.
International Centre for Theoretical Physics, Trieste (Italy)1982
International Centre for Theoretical Physics, Trieste (Italy)1982
AbstractAbstract
[en] In this review article we firstly discuss diffusion process in general followed by a brief survey of diffusion studies in AMsup(s) and MGsup(s). Then we report our results of our study on diffusion in amorphous Cu-Ag thin films
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Aug 1982; 33 p
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Report
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[en] Magnetic and 57Fe Moessbauer measurements are reported for amorphous (Nd, Fe). The ordering temperatures, but not the spontaneous magnetisation, are strongly influenced by the preparation conditions. A broad hyperfine field distribution, slightly increasing with increasing Nd content, is observed at 77 K. The mean hyperfine fields remain constant
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Source
International Conference on Magnetism; Paris (France); 25-29 Jul 1988
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Journal Article
Literature Type
Conference
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Journal de Physique (Les Ulis), Colloque; ISSN 0449-1947; ; CODEN JPQCA; v. 49(C8); p. C8.1353-C8.1354
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Reda, I.M.; Hafner, J.; Pongratz, P.; Wagendristel, A.; Bangert, H.; Bhat, P.K.
International Centre for Theoretical Physics, Trieste (Italy)1982
International Centre for Theoretical Physics, Trieste (Italy)1982
AbstractAbstract
[en] Films produced by quenching Cu-Ag vapour onto cooled substrates at liquid nitrogen temperature have been investigated using electron microscopy, electron diffraction and electrical resistivity measurements. In the composition range from 30 to 70 at% Cu the as quenched films are amorphous, and within the range of 35 to 63 at% Cu the amorphous phase is stable above room temperature with a maximum crystallization temperature Tsub(c)=381 K at 47.5 at% Cu. Crystallization results in the formation of a supersaturated fcc solid solution which decomposes in a second crystallization step. The effect of deposition rate, film thickness, temperature and surface of the substrate, and most importantly of the composition on the transition temperatures has been investigated. A comparative study of the formation of amorphous phases in a wide variety of Cu-based alloys is presented. (author)
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Jun 1982; 30 p
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