Optimization of scintillator thickness for registration of x-ray and gamma radiation over a wide energy range
[en] A theoretical analysis of luminous-flux intensity as a function of crystal thickness is performed for various photon energies, and the optimal thicknesses of CsI(Tl), CdWO4, Bi4Ge3O12, and ZnSe crystals are determined for registration of photons with energies of from a few kiloelectron volts to hundreds of megaelectron volts
Journal
Instruments and Experimental Techniques (English Translation); ISSN 0020-4412; 
; CODEN INETA; v. 31(5); p. 1303-1307
; CODEN INETA; v. 31(5); p. 1303-1307