[en] Total-Reflection X-ray Fluorescence spectrometry (TRXF) is known for its high sensitivity down to Pg-level or sub ppb level, respectively. Therefore the spectrometry is considered as a most competitive tool in the application of trace element analysis. The technique of TRXF was investigated in the laboratory. But small isotope X-γ source is chosen as an exciting source instead of general X-ray tube. From the primitive experiment the conclusion proved that the condition of total reflection can be built and the analysis sensitivity of TRXF is higher than that of normal x-ray analysis