An approach in determination of the orientations of dislocations with synchrotron radiation
Yu, W.-L.; Zheng, Q.-J.; Tian, Y.-L.; Huang, W.-X., E-mail: wlyu@ysu.edu.cn2002
AbstractAbstract
[en] Several techniques such as stereopair diffraction, topo-tomography have been used previously to determine the direction of three-dimensional defects in crystals using monochromic radiation. A new method is proposed here to calculate the orientation of dislocations using white synchrotron radiation, simple and convenient to utilize
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Source
S0168900202011336; Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Record Type
Journal Article
Journal
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment; ISSN 0168-9002; ; CODEN NIMAER; v. 491(1-2); p. 302-306
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