X-ray dose enhancement effects on N80C196KC20 chips
AbstractAbstract
[en] The characteristics' degradation and X-ray enhancement effects of N80C196KC20 chips were presented. The X-ray and 60Co irradiations of N80C196KC20 chips from Intel Company were performed to investigate the response of operating currents Icc. The operation failure symbolizes the total dose response of the chips. The total dose failure level of the chips is very low, and the γ total dose failure is about 165 Gy(Si). The operating current of the chip increases significantly when failure of the chip happens. The X-ray enhanced factor of N80C196KC20 chip is measured and the X-ray enhancement mechanism is studied. (authors)
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2 figs., 5 refs.
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Journal Article
Journal
Nuclear Techniques; ISSN 0253-3219; ; v. 29(3); p. 198-201
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Descriptors (DEC)
BETA DECAY RADIOISOTOPES, BETA-MINUS DECAY RADIOISOTOPES, COBALT ISOTOPES, ELECTROMAGNETIC RADIATION, INTERMEDIATE MASS NUCLEI, INTERNAL CONVERSION RADIOISOTOPES, IONIZING RADIATIONS, ISOMERIC TRANSITION ISOTOPES, ISOTOPES, MINUTES LIVING RADIOISOTOPES, NUCLEI, ODD-ODD NUCLEI, RADIATIONS, RADIOISOTOPES, YEARS LIVING RADIOISOTOPES
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