X-ray lines relative intensity depending on detector efficiency, foils and cases thickness for primary and scattered spectra
AbstractAbstract
[en] Primary and Compton scattered radiation spectra from radioactive source 241Am were measured in various geometry and for various targets. Spectral lines intensity of characteristic X-ray radiation (CXR), Compton and Rayleigh scattering are defined. The back scattering peak for a line 59.54 keV was explored. X-ray quanta were registered by the packaged Si detector 300mm and input Al foil 10mm thicknesses. Radiation interaction with targets and detector atoms was simulated in software code GEANT 4 (LE). Simulated spectra, quanta registration efficiency and secondary calculated radiation spectra at 90o...160o are compared with experimentally measured energy distributions.
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Journal Article
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Voprosy Atomnoj Nauki i Tekhniki; ISSN 1562-6016; ; (no.3-55/73); p. 42-49
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ACTINIDE NUCLEI, ALPHA DECAY RADIOISOTOPES, AMERICIUM ISOTOPES, BASIC INTERACTIONS, COHERENT SCATTERING, ELASTIC SCATTERING, ELECTROMAGNETIC INTERACTIONS, ELECTROMAGNETIC RADIATION, ELEMENTS, HEAVY NUCLEI, INTERACTIONS, IONIZING RADIATIONS, ISOTOPES, MEASURING INSTRUMENTS, METALS, NUCLEI, ODD-EVEN NUCLEI, RADIATION DETECTORS, RADIATIONS, RADIOISOTOPES, SCATTERING, SEMICONDUCTOR DETECTORS, SIMULATION, SPECTRA, SPONTANEOUS FISSION RADIOISOTOPES, YEARS LIVING RADIOISOTOPES
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