Christoph Beyerstedt, Jonas Meier, Fabian Speicher, Ralf Wunderlich, Stefan Heinen. An Event-Driven System-Level Noise Analysis Methodology for RF Systems. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2021, Grenoble, France, February 1-5, 2021. pages 380-385, IEEE, 2021. [doi]
Abstract is missing.