Tinghuan Chen, Qi Sun, Canhui Zhan, Changze Liu, Huatao Yu, Bei Yu 0001. Analog IC Aging-induced Degradation Estimation via Heterogeneous Graph Convolutional Networks. In ASPDAC '21: 26th Asia and South Pacific Design Automation Conference, Tokyo, Japan, January 18-21, 2021. pages 898-903, ACM, 2021. [doi]
Abstract is missing.