Jochen A. G. Jess, K. Kalafala, Srinath R. Naidu, Ralph H. J. M. Otten, Chandramouli Visweswariah. Statistical timing for parametric yield prediction of digital integrated circuits. In Proceedings of the 40th Design Automation Conference, DAC 2003, Anaheim, CA, USA, June 2-6, 2003. pages 932-937, ACM, 2003. [doi]
Abstract is missing.