Optimal Second-Order Mutants Reduction Based on MOEA/D

Jing Liu, Zijian Wang. Optimal Second-Order Mutants Reduction Based on MOEA/D. In 23rd IEEE International Conference on Software Quality, Reliability, and Security, QRS 2023 Companion, Chiang Mai, Thailand, October 22-26, 2023. pages 45-54, IEEE, 2023. [doi]

Abstract

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