Amitava Majumdar, Arani Sinha, Nehal Patel, Ramamurthy Setty, Yan Dong, Shu-Hsuan Chou. A Novel mechanism for speed characterization during delay test. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 116-121, IEEE Computer Society, 2011. [doi]
Abstract is missing.